{"title":"一种基于短环形贴片天线的球面近场天线测量用p波段一阶双端口探针","authors":"M. Brandt-Møller, M. Fröhner, O. Breinbjerg","doi":"10.23919/AMTAP.2019.8906390","DOIUrl":null,"url":null,"abstract":"This paper presents a new type of P-band first-order dual-port probe for spherical near-field antenna measurements. The probe is based on the well-known shorted annular patch antenna but some extensions are introduced for the probe application. This probe is mechanically simple which facilitates its manufacturing and operation. In addition, it has high performance for impedance bandwidth, pattern, directivity, and gain.","PeriodicalId":339768,"journal":{"name":"2019 Antenna Measurement Techniques Association Symposium (AMTA)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Simple High-Perfomance P-Band First-Order Dual-Port Probe for Spherical Near-Field Antenna Measurements based on the Shorted Annular Patch Antenna\",\"authors\":\"M. Brandt-Møller, M. Fröhner, O. Breinbjerg\",\"doi\":\"10.23919/AMTAP.2019.8906390\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new type of P-band first-order dual-port probe for spherical near-field antenna measurements. The probe is based on the well-known shorted annular patch antenna but some extensions are introduced for the probe application. This probe is mechanically simple which facilitates its manufacturing and operation. In addition, it has high performance for impedance bandwidth, pattern, directivity, and gain.\",\"PeriodicalId\":339768,\"journal\":{\"name\":\"2019 Antenna Measurement Techniques Association Symposium (AMTA)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 Antenna Measurement Techniques Association Symposium (AMTA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/AMTAP.2019.8906390\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Antenna Measurement Techniques Association Symposium (AMTA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AMTAP.2019.8906390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Simple High-Perfomance P-Band First-Order Dual-Port Probe for Spherical Near-Field Antenna Measurements based on the Shorted Annular Patch Antenna
This paper presents a new type of P-band first-order dual-port probe for spherical near-field antenna measurements. The probe is based on the well-known shorted annular patch antenna but some extensions are introduced for the probe application. This probe is mechanically simple which facilitates its manufacturing and operation. In addition, it has high performance for impedance bandwidth, pattern, directivity, and gain.
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