{"title":"Offner成像光谱仪的光谱响应和信噪比分析","authors":"Zhen-zhou Wu, Zhi-hong Ma","doi":"10.1117/12.900932","DOIUrl":null,"url":null,"abstract":"The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.","PeriodicalId":355017,"journal":{"name":"Photoelectronic Detection and Imaging","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spectral response and SNR analysis of an Offner imaging spectrometer\",\"authors\":\"Zhen-zhou Wu, Zhi-hong Ma\",\"doi\":\"10.1117/12.900932\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.\",\"PeriodicalId\":355017,\"journal\":{\"name\":\"Photoelectronic Detection and Imaging\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Photoelectronic Detection and Imaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.900932\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photoelectronic Detection and Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.900932","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spectral response and SNR analysis of an Offner imaging spectrometer
The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.
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