{"title":"以应用为中心的1.2kV SiC MOSFET建模程序","authors":"A. Shahabi, A. Lemmon, Sujit Banerjee, K. Matocha","doi":"10.1109/APEC.2017.7931202","DOIUrl":null,"url":null,"abstract":"This work presents a novel modeling procedure for SiC power MOSFETs based on the principal concerns of an application designer. The main emphasis of this work is to identify the top priorities of a model suitable for designing power electronics applications and to utilize this knowledge to develop an optimized, empirically-validated model. This paper provides several contributions to the rapidly-advancing field of SiC MOSFET modeling. First, the switching characteristics of SiC MOSFET's are studied and particular regions of the I-V space are identified which dominate the transient behavior of the device under inductively-loaded conditions. Second, a sub-circuit-based model topology is proposed, which balances the need for accuracy against the application designer's need for computational efficiency. Third, a MATLAB-based tuning procedure is introduced that leverages a powerful optimization algorithm and automatically invokes the SPICE environment to generate model output for tuning and validation purposes. Fourth, empirical validation of the developed model is provided by comparison of the transient model output with double-pulse test results. The outcome of this work is a simple and computationally-efficient model for 1.2 kV SiC MOSFET's which nevertheless maintains sufficient accuracy to satisfy the needs of power electronics application designers.","PeriodicalId":201289,"journal":{"name":"2017 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Application-focused modeling procedure for 1.2kV SiC MOSFET's\",\"authors\":\"A. Shahabi, A. Lemmon, Sujit Banerjee, K. Matocha\",\"doi\":\"10.1109/APEC.2017.7931202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a novel modeling procedure for SiC power MOSFETs based on the principal concerns of an application designer. The main emphasis of this work is to identify the top priorities of a model suitable for designing power electronics applications and to utilize this knowledge to develop an optimized, empirically-validated model. This paper provides several contributions to the rapidly-advancing field of SiC MOSFET modeling. First, the switching characteristics of SiC MOSFET's are studied and particular regions of the I-V space are identified which dominate the transient behavior of the device under inductively-loaded conditions. Second, a sub-circuit-based model topology is proposed, which balances the need for accuracy against the application designer's need for computational efficiency. Third, a MATLAB-based tuning procedure is introduced that leverages a powerful optimization algorithm and automatically invokes the SPICE environment to generate model output for tuning and validation purposes. Fourth, empirical validation of the developed model is provided by comparison of the transient model output with double-pulse test results. The outcome of this work is a simple and computationally-efficient model for 1.2 kV SiC MOSFET's which nevertheless maintains sufficient accuracy to satisfy the needs of power electronics application designers.\",\"PeriodicalId\":201289,\"journal\":{\"name\":\"2017 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.2017.7931202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Applied Power Electronics Conference and Exposition (APEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2017.7931202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
摘要
本文基于应用设计者的主要关注点,提出了一种新颖的SiC功率mosfet建模方法。这项工作的主要重点是确定适合设计电力电子应用的模型的优先级,并利用这些知识开发优化的,经验验证的模型。本文为快速发展的SiC MOSFET建模领域提供了一些贡献。首先,研究了SiC MOSFET的开关特性,并确定了在电感负载条件下控制器件瞬态行为的特定I-V空间区域。其次,提出了一种基于子电路的模型拓扑,它平衡了对精度的需求和应用设计者对计算效率的需求。第三,介绍了基于matlab的调优过程,该过程利用强大的优化算法并自动调用SPICE环境来生成用于调优和验证目的的模型输出。第四,通过瞬态模型输出与双脉冲试验结果的比较,对所建立的模型进行了实证验证。这项工作的结果是一个简单和计算效率高的1.2 kV SiC MOSFET模型,但仍保持足够的精度,以满足电力电子应用设计人员的需求。
Application-focused modeling procedure for 1.2kV SiC MOSFET's
This work presents a novel modeling procedure for SiC power MOSFETs based on the principal concerns of an application designer. The main emphasis of this work is to identify the top priorities of a model suitable for designing power electronics applications and to utilize this knowledge to develop an optimized, empirically-validated model. This paper provides several contributions to the rapidly-advancing field of SiC MOSFET modeling. First, the switching characteristics of SiC MOSFET's are studied and particular regions of the I-V space are identified which dominate the transient behavior of the device under inductively-loaded conditions. Second, a sub-circuit-based model topology is proposed, which balances the need for accuracy against the application designer's need for computational efficiency. Third, a MATLAB-based tuning procedure is introduced that leverages a powerful optimization algorithm and automatically invokes the SPICE environment to generate model output for tuning and validation purposes. Fourth, empirical validation of the developed model is provided by comparison of the transient model output with double-pulse test results. The outcome of this work is a simple and computationally-efficient model for 1.2 kV SiC MOSFET's which nevertheless maintains sufficient accuracy to satisfy the needs of power electronics application designers.