{"title":"PEPC复合物中的电荷输运机制","authors":"S. A. Moiz, M.M. Ahmed, K. Karimov","doi":"10.1109/ICET.2005.1558901","DOIUrl":null,"url":null,"abstract":"In thisstudycurrent-voltage (1- V) characteristics of thin films of poly-N- epoxipropylcarbazole (PEPC)dopedwithAnthracene (An)havebeeninvestigated. ThePEPCfilms were grownonNickel (Ni) substrates, atroomtemperature, byusing acentrifugal machine operated at277g.I-V characteristics werethenevaluated asa function of temperature ranging from30to60'C.Reversible rectifying characteristics wereexhibited bythedevices inwhichthemagnitude ofcurrentincreases with increasing valuesoftemperature. Thishasbeen explained withtemperature dependent hopping process offreecarriers intheorganic films having positional aswellasenergetic disorders. Whereas ithas beenshownthatthenonlinear I-Vcharacteristics of thefabricated devices follow SpaceChargeLimited Current (SCLC)model. By applying thecorrelated Gaussian disorder mobilitv modeltotheexperimental SCLC,theenergetic disorder parameter andaverage intersite spacing between hopping locations havebeen calculated. It has beendemonstrated thatthe magnitude ofenergetic disorderness and average intersite distance inPEPCcomplex isrelatively higher whichcould beacause oflowholemobility. Indcex Tterms-Gaussian disorder model,organic semiconductors, temperature dependent charactcristics, holemobility.","PeriodicalId":222828,"journal":{"name":"Proceedings of the IEEE Symposium on Emerging Technologies, 2005.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Charge transport mechanism in PEPC complex\",\"authors\":\"S. A. Moiz, M.M. Ahmed, K. Karimov\",\"doi\":\"10.1109/ICET.2005.1558901\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In thisstudycurrent-voltage (1- V) characteristics of thin films of poly-N- epoxipropylcarbazole (PEPC)dopedwithAnthracene (An)havebeeninvestigated. ThePEPCfilms were grownonNickel (Ni) substrates, atroomtemperature, byusing acentrifugal machine operated at277g.I-V characteristics werethenevaluated asa function of temperature ranging from30to60'C.Reversible rectifying characteristics wereexhibited bythedevices inwhichthemagnitude ofcurrentincreases with increasing valuesoftemperature. Thishasbeen explained withtemperature dependent hopping process offreecarriers intheorganic films having positional aswellasenergetic disorders. Whereas ithas beenshownthatthenonlinear I-Vcharacteristics of thefabricated devices follow SpaceChargeLimited Current (SCLC)model. By applying thecorrelated Gaussian disorder mobilitv modeltotheexperimental SCLC,theenergetic disorder parameter andaverage intersite spacing between hopping locations havebeen calculated. It has beendemonstrated thatthe magnitude ofenergetic disorderness and average intersite distance inPEPCcomplex isrelatively higher whichcould beacause oflowholemobility. Indcex Tterms-Gaussian disorder model,organic semiconductors, temperature dependent charactcristics, holemobility.\",\"PeriodicalId\":222828,\"journal\":{\"name\":\"Proceedings of the IEEE Symposium on Emerging Technologies, 2005.\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE Symposium on Emerging Technologies, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICET.2005.1558901\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE Symposium on Emerging Technologies, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICET.2005.1558901","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}