{"title":"基于多路微波干扰的高精度微波光子真时延测量","authors":"Boyu Chen, Xiaoxiao Xue, Shangyuan Li, Xiaoping Zheng, Hanyi Zhang, Bingkun Zhou","doi":"10.1109/IPCON.2016.7831195","DOIUrl":null,"url":null,"abstract":"A novel true time delay measurement method based on multi-channel microwave interference is demonstrated for characterizing microwave photonic true-time-delay lines. A relative time delay measurement precision of 1 ps is achieved, which demonstrate the advantages over traditional methods in accuracy and stability.","PeriodicalId":396459,"journal":{"name":"2016 IEEE Photonics Conference (IPC)","volume":"48 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-precision microwave photonic true time delay measurement based on multi-channel microwave interference\",\"authors\":\"Boyu Chen, Xiaoxiao Xue, Shangyuan Li, Xiaoping Zheng, Hanyi Zhang, Bingkun Zhou\",\"doi\":\"10.1109/IPCON.2016.7831195\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel true time delay measurement method based on multi-channel microwave interference is demonstrated for characterizing microwave photonic true-time-delay lines. A relative time delay measurement precision of 1 ps is achieved, which demonstrate the advantages over traditional methods in accuracy and stability.\",\"PeriodicalId\":396459,\"journal\":{\"name\":\"2016 IEEE Photonics Conference (IPC)\",\"volume\":\"48 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Photonics Conference (IPC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPCON.2016.7831195\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Photonics Conference (IPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPCON.2016.7831195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-precision microwave photonic true time delay measurement based on multi-channel microwave interference
A novel true time delay measurement method based on multi-channel microwave interference is demonstrated for characterizing microwave photonic true-time-delay lines. A relative time delay measurement precision of 1 ps is achieved, which demonstrate the advantages over traditional methods in accuracy and stability.