{"title":"高效的大电平时钟电路的最小区重定时","authors":"N. Maheshwari, S. Sapatnekar","doi":"10.1109/DATE.1998.655956","DOIUrl":null,"url":null,"abstract":"Delay-constrained area optimization is an important step in synthesis of VLSI circuits. Minimum area (minarea) retiming is a powerful technique to solve this problem. The minarea retiming problem has been formulated as a linear program; in this work we present techniques for reducing the size of this linear program and efficient techniques for generating it. This results in an efficient minarea retiming method for large level-clocked circuits (with tens of thousands of gates).","PeriodicalId":179207,"journal":{"name":"Proceedings Design, Automation and Test in Europe","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Efficient minarea retiming of large level-clocked circuits\",\"authors\":\"N. Maheshwari, S. Sapatnekar\",\"doi\":\"10.1109/DATE.1998.655956\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Delay-constrained area optimization is an important step in synthesis of VLSI circuits. Minimum area (minarea) retiming is a powerful technique to solve this problem. The minarea retiming problem has been formulated as a linear program; in this work we present techniques for reducing the size of this linear program and efficient techniques for generating it. This results in an efficient minarea retiming method for large level-clocked circuits (with tens of thousands of gates).\",\"PeriodicalId\":179207,\"journal\":{\"name\":\"Proceedings Design, Automation and Test in Europe\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-02-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Design, Automation and Test in Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.1998.655956\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Design, Automation and Test in Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.1998.655956","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient minarea retiming of large level-clocked circuits
Delay-constrained area optimization is an important step in synthesis of VLSI circuits. Minimum area (minarea) retiming is a powerful technique to solve this problem. The minarea retiming problem has been formulated as a linear program; in this work we present techniques for reducing the size of this linear program and efficient techniques for generating it. This results in an efficient minarea retiming method for large level-clocked circuits (with tens of thousands of gates).