K. Cho, S. Suk, Y. Yeoh, Ming Li, K. Yeo, Dong-Won Kim, S. Hwang, Donggun Park, B. Ryu
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Observation of Single Electron Tunneling and Ballistic Transport in Twin Silicon Nanowire MOSFETs (TSNWFETs) Fabricated by Top-Down CMOS Process
the authors report transport experiments on gate-all-around (GAA) TSNWFETs fabricated by top-down CMOS processes. The nanowire with 45 nm gate length exhibits single electron tunneling, and the total capacitance extracted from the measured data is in good agreement with the self-capacitance of an ideal cylinder. The nanowire with 125 nm gate length shows conductance quantization suggesting ballistic transport. The temperature dependence of the conductance steps is consistent with the crossover from classical to ballistic
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