{"title":"射频电路的热载波和软击穿可靠性","authors":"E. Xiao, J. Yuan, Hong Yang","doi":"10.1109/SMELEC.2002.1217816","DOIUrl":null,"url":null,"abstract":"RF circuit performance degradations due to hot carrier (HC) and soft breakdown (SBD) effects are studied with 0.16 /spl mu/m CMOS technology. Two design techniques are proposed to reduce the HC and SBD effects on RF circuits. A low noise amplifier (LNA) and a voltage-controlled oscillator (VCO) are used to verify the design techniques that can be used to build more reliable RF circuits.","PeriodicalId":211819,"journal":{"name":"ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Hot carrier and soft breakdown reliability for RF circuits\",\"authors\":\"E. Xiao, J. Yuan, Hong Yang\",\"doi\":\"10.1109/SMELEC.2002.1217816\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RF circuit performance degradations due to hot carrier (HC) and soft breakdown (SBD) effects are studied with 0.16 /spl mu/m CMOS technology. Two design techniques are proposed to reduce the HC and SBD effects on RF circuits. A low noise amplifier (LNA) and a voltage-controlled oscillator (VCO) are used to verify the design techniques that can be used to build more reliable RF circuits.\",\"PeriodicalId\":211819,\"journal\":{\"name\":\"ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMELEC.2002.1217816\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMELEC.2002.1217816","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hot carrier and soft breakdown reliability for RF circuits
RF circuit performance degradations due to hot carrier (HC) and soft breakdown (SBD) effects are studied with 0.16 /spl mu/m CMOS technology. Two design techniques are proposed to reduce the HC and SBD effects on RF circuits. A low noise amplifier (LNA) and a voltage-controlled oscillator (VCO) are used to verify the design techniques that can be used to build more reliable RF circuits.