{"title":"负载周期对交流挤压电缆可靠性的影响:减少资格预审测试是否总是正确的选择?","authors":"G. Mazzanti, M. Marzinotto","doi":"10.1109/ICSD.2013.6619723","DOIUrl":null,"url":null,"abstract":"In this paper, a new method is proposed for the estimation of time to failure percentiles and life fraction lost in the so-called “Extension of pre-Qualification (EQ) test” according to CIGRE TBs 303. The method accounts for the time-varying temperature during the EQ load cycles via an approach that relies on: 1) Miner's law of cumulated aging; 2) an improved voltage-time characteristic that includes the electro-thermal stress; 3) a probabilistic framework based on the Weibull hypothesis. On these grounds, an alternative to the EQ test is proposed, referred to as “Improved Extension of Qualification (IEQ) test”, based on a more strict correlation between cable insulation reliability in design stress conditions and that during the test itself, thereby taking into account the electro-thermal endurance features of a given extruded cable design.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Effects of load cycles on AC extruded cable reliability: Is a reduced pre-qualification test always the right choice?\",\"authors\":\"G. Mazzanti, M. Marzinotto\",\"doi\":\"10.1109/ICSD.2013.6619723\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a new method is proposed for the estimation of time to failure percentiles and life fraction lost in the so-called “Extension of pre-Qualification (EQ) test” according to CIGRE TBs 303. The method accounts for the time-varying temperature during the EQ load cycles via an approach that relies on: 1) Miner's law of cumulated aging; 2) an improved voltage-time characteristic that includes the electro-thermal stress; 3) a probabilistic framework based on the Weibull hypothesis. On these grounds, an alternative to the EQ test is proposed, referred to as “Improved Extension of Qualification (IEQ) test”, based on a more strict correlation between cable insulation reliability in design stress conditions and that during the test itself, thereby taking into account the electro-thermal endurance features of a given extruded cable design.\",\"PeriodicalId\":437475,\"journal\":{\"name\":\"2013 IEEE International Conference on Solid Dielectrics (ICSD)\",\"volume\":\"145 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Conference on Solid Dielectrics (ICSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.2013.6619723\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.2013.6619723","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effects of load cycles on AC extruded cable reliability: Is a reduced pre-qualification test always the right choice?
In this paper, a new method is proposed for the estimation of time to failure percentiles and life fraction lost in the so-called “Extension of pre-Qualification (EQ) test” according to CIGRE TBs 303. The method accounts for the time-varying temperature during the EQ load cycles via an approach that relies on: 1) Miner's law of cumulated aging; 2) an improved voltage-time characteristic that includes the electro-thermal stress; 3) a probabilistic framework based on the Weibull hypothesis. On these grounds, an alternative to the EQ test is proposed, referred to as “Improved Extension of Qualification (IEQ) test”, based on a more strict correlation between cable insulation reliability in design stress conditions and that during the test itself, thereby taking into account the electro-thermal endurance features of a given extruded cable design.