{"title":"讨论小组(DG)和特别兴趣小组(SIG)总结报告","authors":"Y. Nelson","doi":"10.1109/IRWS.2005.1609595","DOIUrl":null,"url":null,"abstract":"The special interest group discussed the following topics : stress temperature conditions; Kelvin test structures; via chains; and proper choice of upper and lower metal connections","PeriodicalId":214130,"journal":{"name":"2005 IEEE International Integrated Reliability Workshop","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Discussion Groups (DG) and Special Interest Group (SIG) Summary Reports\",\"authors\":\"Y. Nelson\",\"doi\":\"10.1109/IRWS.2005.1609595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The special interest group discussed the following topics : stress temperature conditions; Kelvin test structures; via chains; and proper choice of upper and lower metal connections\",\"PeriodicalId\":214130,\"journal\":{\"name\":\"2005 IEEE International Integrated Reliability Workshop\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE International Integrated Reliability Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRWS.2005.1609595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Integrated Reliability Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.2005.1609595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Discussion Groups (DG) and Special Interest Group (SIG) Summary Reports
The special interest group discussed the following topics : stress temperature conditions; Kelvin test structures; via chains; and proper choice of upper and lower metal connections
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
