先进球栅阵列封装机械冲击试验响应面优化

Muhammad Syahmi Ahmad Tamili
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引用次数: 0

摘要

本研究的重点是利用有限元分析优化先进球栅阵列(BGA)封装的机械冲击测试。本研究旨在分析先进BGA封装的机械冲击测试参数,并利用响应面法(RSM)优化其机械强度。本研究采用有限元分析和RSM两种方法。该方法包括通过数值实验研究三个参数:冲击频率、隔离高度和焊球直径。为了得到最优的应力、应变和位移三种响应。利用有限元软件对先进的BGA封装进行了数值实验。本研究的结果有助于结果优化,并提供了最重要的参数和响应的理解。高位移影响邻近的电路板零件和焊点,导致断裂的链接和连接。此外,高加速度可能导致螺栓松动,继电器抖动和集成电路(IC)封装中的可变电阻打滑。对数值实验结果进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Response Surface Optimisation of the Mechanical Shock Testing for Advanced Ball Grid Array Package
This research focuses on optimising mechanical shock testing for advanced ball grid array (BGA) packages using finite element analysis. This research aims to analyse the parameters in mechanical shock testing for advanced BGA packages and optimise their mechanical strength using Response Surface Methodology (RSM). This research employs two methods: Finite Element Analysis and RSM.  The methodology involves investigating three parameters: impact frequency, stand-off height, and solder ball diameter through numerical experimentation. Three responses, namely stress, strain, and displacement, are obtained to achieve an optimal result using RSM. The numerical experiments are conducted using finite element software, specifically on advanced BGA packages. The findings of this study contribute to result optimisation and provide an understanding of the most significant parameters and responses. High displacement affects neighbouring circuit board parts and solder joints, leading to broken links and connections. Besides, high acceleration could lead to loose bolts, relay chattering, and slipping of the variable resistor in integrated circuit (IC) packages. The validation process is performed to verify the results obtained from the numerical experiments.
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