面向模型的TFT模型参数自动提取方法

2021 28th International Conference on Mixed Design of Integrated Circuits and System Pub Date : 2021-06-24 DOI:10.23919/MIXDES52406.2021.9497605

M. Fino, P. Barquinha

{"title":"面向模型的TFT模型参数自动提取方法","authors":"M. Fino, P. Barquinha","doi":"10.23919/MIXDES52406.2021.9497605","DOIUrl":null,"url":null,"abstract":"The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.","PeriodicalId":375541,"journal":{"name":"2021 28th International Conference on Mixed Design of Integrated Circuits and System","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Model-oriented Methodology for the Automatic Parameter Extraction of TFT Model\",\"authors\":\"M. Fino, P. Barquinha\",\"doi\":\"10.23919/MIXDES52406.2021.9497605\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.\",\"PeriodicalId\":375541,\"journal\":{\"name\":\"2021 28th International Conference on Mixed Design of Integrated Circuits and System\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 28th International Conference on Mixed Design of Integrated Circuits and System\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MIXDES52406.2021.9497605\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 28th International Conference on Mixed Design of Integrated Circuits and System","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIXDES52406.2021.9497605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文提出了一种模型驱动的方法来确定薄膜晶体管的紧凑模型参数。提出了在python中实现所提出的提取方法。验证了所得结果对器件特性的有效性。本文还讨论了所提出的方法相对于先前提出的方法的优势。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A Model-oriented Methodology for the Automatic Parameter Extraction of TFT Model

The paper presents a model-driven methodology for the determination of thin-film transistors compact model parameters. The implementation of the proposed extraction methodology in python is presented. The validity of results obtained against devices characteristics is demonstrated. The advantage of the proposed methodology against a previously proposed approached is also discussed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2021 28th International Conference on Mixed Design of Integrated Circuits and System

自引率

0.00%

发文量