Jun Ai, Doo-Hwan Bae, Xiaoying Bai, David Benavides, Arun Chakrapani, Junjie Chen, Frédéric Dadeau, Junhua Ding, T. Dohi, Mercedes G. Merayo, Osamu Mizuno, Tien Nguyen, Manuel Nuñez, H. Okamura, Hailong Sun, Linzhang Wang, Husnu Yenigun
{"title":"QRS 2018项目委员会","authors":"Jun Ai, Doo-Hwan Bae, Xiaoying Bai, David Benavides, Arun Chakrapani, Junjie Chen, Frédéric Dadeau, Junhua Ding, T. Dohi, Mercedes G. Merayo, Osamu Mizuno, Tien Nguyen, Manuel Nuñez, H. Okamura, Hailong Sun, Linzhang Wang, Husnu Yenigun","doi":"10.1109/qrs-c.2018.00010","DOIUrl":null,"url":null,"abstract":"Jun Ai, Beihang University, China Domenico Amalfitano, University of Naples Federico II, France Doo-Hwan Bae, Korea Advanced Institute of Science and Technology, Korea Xiaoying Bai, Tsinghua University, China David Benavides, University of Seville, Spain Antonia Bertolino, Italian National Research Council, Italy Mario Bravetti, Università di Bologna, Italy Christof Budnik, Siemens, Germany Yan Cai, Chinese Academy of Sciences, China Emilia Cambronero, Universidad Castilla-La Mancha, Spain Ana Cavalli, IT SudParis, France Arun Chakrapani Rao, University of Warwick, UK W.K. Chan, City University of Hong Kong, Hong Kong Junjie Chen, Peking University, China Sunita Chulani, Cisco, USA Frederic Dadeau, University of Franche-Comté, France Junhua Ding, East Carolina University, USA Tadashi Dohi, Hiroshima University, Japan Wei Dong, National University of Defense Technology, China Yunwei Dong, Northwestern Polytechnical University, China Khaled El-Fakih, American University of Sharjah, UAE Sadik Esmelioglu, Middle East Technical University, Turkey Hugues Evrard, Imperial College London, UK Joao Pascoal Faria, University of Porto, Portugal Sudipto Ghosh, Colorado State University, USA Arnaud Gotlieb, Simula Research Laboratory, Norway Matthias Güdemann, diffBlue, UK Rajiv Gupta, University of California, Riverside, USA Song Huang, Army Engineering University, China Bo Jiang, Beihang University, China He Jiang, Dalian University of Technology, China Yu Jiang, Tsinghua University, China Xiaoyuan Jing, Wuhan University, China Roland Jochem, TU Berlin, Germany Yves Le Traon, University of Luxembourg, Luxembourg Jenny Li, Kean University, USA Huai Liu, Victoria University, Australia Lin Liu, Tsinghua University, China Shaoying Liu, Hosei University, Japan Liang Luo, University of Electronic Science and Technology of China, China Henrique Madeira, University of Coimbra, Portugal Dusica Marijan, Simula Research Laboratory, Norway Bruce McMillin, Missouri University of Science and Technology, USA","PeriodicalId":199384,"journal":{"name":"2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"QRS 2018 Program Committee\",\"authors\":\"Jun Ai, Doo-Hwan Bae, Xiaoying Bai, David Benavides, Arun Chakrapani, Junjie Chen, Frédéric Dadeau, Junhua Ding, T. 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Chan, City University of Hong Kong, Hong Kong Junjie Chen, Peking University, China Sunita Chulani, Cisco, USA Frederic Dadeau, University of Franche-Comté, France Junhua Ding, East Carolina University, USA Tadashi Dohi, Hiroshima University, Japan Wei Dong, National University of Defense Technology, China Yunwei Dong, Northwestern Polytechnical University, China Khaled El-Fakih, American University of Sharjah, UAE Sadik Esmelioglu, Middle East Technical University, Turkey Hugues Evrard, Imperial College London, UK Joao Pascoal Faria, University of Porto, Portugal Sudipto Ghosh, Colorado State University, USA Arnaud Gotlieb, Simula Research Laboratory, Norway Matthias Güdemann, diffBlue, UK Rajiv Gupta, University of California, Riverside, USA Song Huang, Army Engineering University, China Bo Jiang, Beihang University, China He Jiang, Dalian University of Technology, China Yu Jiang, Tsinghua University, China Xiaoyuan Jing, Wuhan University, China Roland Jochem, TU Berlin, Germany Yves Le Traon, University of Luxembourg, Luxembourg Jenny Li, Kean University, USA Huai Liu, Victoria University, Australia Lin Liu, Tsinghua University, China Shaoying Liu, Hosei University, Japan Liang Luo, University of Electronic Science and Technology of China, China Henrique Madeira, University of Coimbra, Portugal Dusica Marijan, Simula Research Laboratory, Norway Bruce McMillin, Missouri University of Science and Technology, USA\",\"PeriodicalId\":199384,\"journal\":{\"name\":\"2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/qrs-c.2018.00010\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/qrs-c.2018.00010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Jun Ai, Beihang University, China Domenico Amalfitano, University of Naples Federico II, France Doo-Hwan Bae, Korea Advanced Institute of Science and Technology, Korea Xiaoying Bai, Tsinghua University, China David Benavides, University of Seville, Spain Antonia Bertolino, Italian National Research Council, Italy Mario Bravetti, Università di Bologna, Italy Christof Budnik, Siemens, Germany Yan Cai, Chinese Academy of Sciences, China Emilia Cambronero, Universidad Castilla-La Mancha, Spain Ana Cavalli, IT SudParis, France Arun Chakrapani Rao, University of Warwick, UK W.K. Chan, City University of Hong Kong, Hong Kong Junjie Chen, Peking University, China Sunita Chulani, Cisco, USA Frederic Dadeau, University of Franche-Comté, France Junhua Ding, East Carolina University, USA Tadashi Dohi, Hiroshima University, Japan Wei Dong, National University of Defense Technology, China Yunwei Dong, Northwestern Polytechnical University, China Khaled El-Fakih, American University of Sharjah, UAE Sadik Esmelioglu, Middle East Technical University, Turkey Hugues Evrard, Imperial College London, UK Joao Pascoal Faria, University of Porto, Portugal Sudipto Ghosh, Colorado State University, USA Arnaud Gotlieb, Simula Research Laboratory, Norway Matthias Güdemann, diffBlue, UK Rajiv Gupta, University of California, Riverside, USA Song Huang, Army Engineering University, China Bo Jiang, Beihang University, China He Jiang, Dalian University of Technology, China Yu Jiang, Tsinghua University, China Xiaoyuan Jing, Wuhan University, China Roland Jochem, TU Berlin, Germany Yves Le Traon, University of Luxembourg, Luxembourg Jenny Li, Kean University, USA Huai Liu, Victoria University, Australia Lin Liu, Tsinghua University, China Shaoying Liu, Hosei University, Japan Liang Luo, University of Electronic Science and Technology of China, China Henrique Madeira, University of Coimbra, Portugal Dusica Marijan, Simula Research Laboratory, Norway Bruce McMillin, Missouri University of Science and Technology, USA