利用增强有效介质法精确而简单地设计高阻抗表面结构

G. Niyomjan, Y. Huang
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引用次数: 2

摘要

有效介质法是目前设计蘑菇状高阻抗表面结构最常用的方法。这主要是由于它的简单和灵活,但是它也有一些缺点,比如它的准确性。如果直接使用它来设计HIS结构而没有应用适当的规则和限制,这可能会导致设计不准确。因此,需要进一步的调优和修改。这些过程通常是通过基于数值方法的仿真工具来完成的,例如有限元法(FEM),这可能会花费大量的时间和计算资源。本文的目的是探讨改进传统有效介质法的可能性,以提供简单、快速和准确的方法。这是通过设置参数研究来完成的,以获得在应用该方法之前将使用的一组所需的规则和限制。设计并创建了一个测试结构来验证该方法。利用改进方法和数值模拟,得到了反射相角(-90 ~ 90度)与表面阻抗在4 ~ 8 GHz范围内非常吻合的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Accurate and Simple Design of High Impedance Surface Structure Using an Enhanced Effective Medium Method
The effective medium method is by far the most commonly used method in designing mushroom-like high impedance surface (HIS) structures. This is mainly due to its simplicity and flexibility, however it has some drawbacks such as its accuracy. If it is used directly to design a HIS structure without applying proper rules and limits, this can cause an inaccuracy to the design. As a result, further tuning and modifying will be required. These processes are usually done by using simulation tools based on numerical methods such as the finite element method (FEM) which might take enormous amount of time and computational resources. The aim of this paper is to investigate the possibilities of improving the conventional effective medium method to offer simplicity, speed and accuracy. This is done by setting a parametric study to obtain a required set of rules and limits that will be used prior to applying the method. A test structure has been designed and created to validate the method. A close agreement between the values of reflection phase angle (-90 to 90 degree) and surface impedance from 4 to 8 GHz is obtained by using this proposed improved method and numerical simulation.
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