美国和日本电子器件行业竞争性产品和制造过程基准与逆向工程的比较:使用频率和感知价值

B. Vojak, Toshihisa Hatakeyama
{"title":"美国和日本电子器件行业竞争性产品和制造过程基准与逆向工程的比较:使用频率和感知价值","authors":"B. Vojak, Toshihisa Hatakeyama","doi":"10.1109/IEMC.2006.4279868","DOIUrl":null,"url":null,"abstract":"A survey of participants in the electron device industry has been conducted to better understand the differences between American and Japanese practitioners of competitive product and manufacturing process benchmarking and reverse engineering (CP/MPBRE). We have studied the responses of n = 221 survey participants who self-describe as new product and manufacturing process engineering practitioners. Consistent with the general literature on this topic, we observe that more Japanese than American engineers in the electron device industry engage in CP/MPBRE. However, expanding on the general literature, we find that, of those who do practice CP/MPBRE, American and Japanese practitioners in this industry do so comparably in terms of frequency of use and perceptions of value. We discuss the implications of these findings.","PeriodicalId":153115,"journal":{"name":"2006 IEEE International Engineering Management Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Comparison of American and Japanese Competitive Product and Manufacturing Process Benchmarking and Reverse Engineering in the Electron Device Industry: Frequency of Use and Perceived Value\",\"authors\":\"B. Vojak, Toshihisa Hatakeyama\",\"doi\":\"10.1109/IEMC.2006.4279868\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A survey of participants in the electron device industry has been conducted to better understand the differences between American and Japanese practitioners of competitive product and manufacturing process benchmarking and reverse engineering (CP/MPBRE). We have studied the responses of n = 221 survey participants who self-describe as new product and manufacturing process engineering practitioners. Consistent with the general literature on this topic, we observe that more Japanese than American engineers in the electron device industry engage in CP/MPBRE. However, expanding on the general literature, we find that, of those who do practice CP/MPBRE, American and Japanese practitioners in this industry do so comparably in terms of frequency of use and perceptions of value. We discuss the implications of these findings.\",\"PeriodicalId\":153115,\"journal\":{\"name\":\"2006 IEEE International Engineering Management Conference\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE International Engineering Management Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMC.2006.4279868\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Engineering Management Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMC.2006.4279868","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

为了更好地了解美国和日本在竞争性产品和制造过程基准和逆向工程(CP/MPBRE)方面的差异,对电子设备行业的参与者进行了一项调查。我们研究了n = 221名自称为新产品和制造工艺工程从业者的调查参与者的反应。与关于该主题的一般文献一致,我们观察到在电子器件行业从事CP/MPBRE的日本工程师多于美国工程师。然而,扩展一般文献,我们发现,在那些实践CP/MPBRE的人中,美国和日本的从业者在使用频率和价值感知方面做得相当。我们将讨论这些发现的含义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Comparison of American and Japanese Competitive Product and Manufacturing Process Benchmarking and Reverse Engineering in the Electron Device Industry: Frequency of Use and Perceived Value
A survey of participants in the electron device industry has been conducted to better understand the differences between American and Japanese practitioners of competitive product and manufacturing process benchmarking and reverse engineering (CP/MPBRE). We have studied the responses of n = 221 survey participants who self-describe as new product and manufacturing process engineering practitioners. Consistent with the general literature on this topic, we observe that more Japanese than American engineers in the electron device industry engage in CP/MPBRE. However, expanding on the general literature, we find that, of those who do practice CP/MPBRE, American and Japanese practitioners in this industry do so comparably in terms of frequency of use and perceptions of value. We discuss the implications of these findings.
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