Influence of heterogeneity solid dielectrics on time up to breakdown

When performing research of failures of high-voltage electric insulating products, isolators etc. it is necessary to use methods of statistical analysis in processing experimental data, finding the function of distribution of failures probabilities being of great importance. Using a computer model, statistical research of isolation failures were carried out for a narrow spectrum of change of the defects characteristics, that is practically for all samples with identical defects in all volume of a sample. The distribution failure probability on the Weibull's diagram is represented by one direct line for any narrow class of defects. The use of the computer model of solid dielectrics aging and breakdown of solid dielectrics under long influence of an electrical field allows study of both statistical and physical laws of dielectrics breakdown. In particular, it expands and deepens the understanding of defect influence on the internal structure of the solid insulator on the time up to breakdown.