基于深度学习的V-I轨迹的电器识别

Peng Zhang, Bowen Gao, Hong Chen, Zhi-Qiang Yu
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引用次数: 0

摘要

非侵入式负载监测的目的之一是通过分析被测电压和电流的变化,将总功耗分解为单个设备的功耗,从而实现对设备负载的识别。设备识别是非侵入式负载监控(NILM)的核心。本文针对实际测量的器具数据,提出了一种在二维V-I轨迹中表征器具和识别器具的方法。提出了一种利用经验模态分解(EMD)对采样数据进行滤波的方法。采用深度学习方法自动提取V-I轨迹图的特征。经实验验证,载荷识别精度较高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Appliance Recognition Using V-I Trajectories based on Deep Learning
One aim of the non-intrusive load monitoring is disaggregate the total power consumption to the power consumption of a single device by analyzing the change in voltage and current measured in order to realize recognition of appliance loads. The appliance identification is the core of the non-intrusive load monitoring (NILM). In this paper, a methodology for characterizing appliances and identifying appliances in a 2-dimensional V-I trajectory is proposed for actual measured appliances data. And a method is proposed to filter the sampled data using Empirical Mode Decomposition (EMD). A deep learning method is applied to automatically extract features from the built V-I trajectory maps. After experiments, the accuracy of load identification is relatively high.
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