Sige Liu, Peng Cheng, Zhuo Chen, Wei Xiang, B. Vucetic, Yonghui Li
{"title":"5g工业物联网中基于上下文强盗学习的质量测试系统","authors":"Sige Liu, Peng Cheng, Zhuo Chen, Wei Xiang, B. Vucetic, Yonghui Li","doi":"10.1109/INDIN51773.2022.9976181","DOIUrl":null,"url":null,"abstract":"The industrial Internet of Things (IIoT) interconnects an exponential number of industrial devices, and more flexible and low-cost communications are widely in demand. The fifth-generation (5G) communication provides two industrial-target technologies, massive machine-type communications (mMTC) and ultra-reliable low-latency communications (URLLC), to meet the demand. We design a 5G-aided quality test system, where various sensors are connected to the base station (BS) and send contextual information via mMTC. The BS and quality test machine transmit short-length commands and small-size feedback to each other via URLLC. The problem is formulated as a long-term optimization one with the purpose of improving the product qualification rate. We develop a novel contextual combinatorial quality test (CC-QT) algorithm to solve the problem. We further derive a performance upper bound of the proposed CC-QT and analyze its computational complexity. Experimental results illustrate the performance of CC-QT and substantiate its superiority over the existing algorithms.","PeriodicalId":359190,"journal":{"name":"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Contextual Bandit Learning Based Quality Test System in 5G-Enabled IIoT\",\"authors\":\"Sige Liu, Peng Cheng, Zhuo Chen, Wei Xiang, B. Vucetic, Yonghui Li\",\"doi\":\"10.1109/INDIN51773.2022.9976181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The industrial Internet of Things (IIoT) interconnects an exponential number of industrial devices, and more flexible and low-cost communications are widely in demand. The fifth-generation (5G) communication provides two industrial-target technologies, massive machine-type communications (mMTC) and ultra-reliable low-latency communications (URLLC), to meet the demand. We design a 5G-aided quality test system, where various sensors are connected to the base station (BS) and send contextual information via mMTC. The BS and quality test machine transmit short-length commands and small-size feedback to each other via URLLC. The problem is formulated as a long-term optimization one with the purpose of improving the product qualification rate. We develop a novel contextual combinatorial quality test (CC-QT) algorithm to solve the problem. We further derive a performance upper bound of the proposed CC-QT and analyze its computational complexity. Experimental results illustrate the performance of CC-QT and substantiate its superiority over the existing algorithms.\",\"PeriodicalId\":359190,\"journal\":{\"name\":\"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INDIN51773.2022.9976181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDIN51773.2022.9976181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Contextual Bandit Learning Based Quality Test System in 5G-Enabled IIoT
The industrial Internet of Things (IIoT) interconnects an exponential number of industrial devices, and more flexible and low-cost communications are widely in demand. The fifth-generation (5G) communication provides two industrial-target technologies, massive machine-type communications (mMTC) and ultra-reliable low-latency communications (URLLC), to meet the demand. We design a 5G-aided quality test system, where various sensors are connected to the base station (BS) and send contextual information via mMTC. The BS and quality test machine transmit short-length commands and small-size feedback to each other via URLLC. The problem is formulated as a long-term optimization one with the purpose of improving the product qualification rate. We develop a novel contextual combinatorial quality test (CC-QT) algorithm to solve the problem. We further derive a performance upper bound of the proposed CC-QT and analyze its computational complexity. Experimental results illustrate the performance of CC-QT and substantiate its superiority over the existing algorithms.