基于层状Bi2O2Se半导体纳米片的亚10mk分辨率热热测量集成fet型传感器

Qifeng Cai, Shuo Liu, Minzhi Du, Lei Xu, Chunyan Zhao, Congwei Tan, Teng Tu, Kun Zhang, H. Peng, Xing Zhang, Ming Li, M. He, Ru Huang
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引用次数: 1

摘要

在这项工作中,我们首次报道了基于层状Bi2O2Se纳米片的高灵敏度热-热测量集成晶体管传感器,其中证明了温度促进硒空位电离和超高的平面内电子迁移率,产生了创纪录的1.5 mK的高温分辨率,并且集成传感器同时检测热,光导,温度敏感性为4.6% K-1,热系数为41.8 μA/K,热响应为>3300 A/W,工作范围为30-200°C。在此基础上,提出了随机共振解耦模型,通过从嵌入噪声中传递相干能量来放大信号,提取耦合信号。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sub-10mK-Resolution Thermal-Bolometric Integrated FET-Type Sensors Based on Layered Bi2O2Se Semiconductor Nanosheets
In this work, we reported high-sensitivity thermal- bolometric integrated transistor sensors based on the layered Bi2O2Se nanosheets for the first time, wherein the temperature- promoted ionization of selenium vacancies and the ultrahigh in-plane electron mobility were demonstrated to yield a recordhigh temperature resolution of 1.5 mK. And the integrated sensors simultaneously detected the thermal, photoconductive, and bolometric stimuli with outstanding performances including the temperature sensitivity of 4.6 %K-1, the bolometric coefficient of 41.8 μA/K, the bolometric response of >3300 A/W, and the working range of 30-200 °C. Furthermore, the stochastic resonance decoupling model was proposed to extract the coupled signals by amplifying signals through the coherent energy transferring from the imbedded noises.
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