聚合物薄膜介电击穿中的薄弱点概念

Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI:10.1109/ICSD.1989.69164

A. Saba, C. Laurent, Y. Segui

{"title":"聚合物薄膜介电击穿中的薄弱点概念","authors":"A. Saba, C. Laurent, Y. Segui","doi":"10.1109/ICSD.1989.69164","DOIUrl":null,"url":null,"abstract":"Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"On the weak spot concept in the dielectric breakdown of thin polymer films\",\"authors\":\"A. Saba, C. Laurent, Y. Segui\",\"doi\":\"10.1109/ICSD.1989.69164\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<<ETX>>\",\"PeriodicalId\":184126,\"journal\":{\"name\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1989.69164\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

在低压(2.5 khz)辉光放电二极管系统中，以六甲基二硅氧烷蒸气为原料，在0.25 torr的压力下制备薄膜。进行了斜坡和阶跃试验，获得了电压击穿数据。对弱点击穿数据的统计分析表明，可以从它们的场泛函依赖中提取介电信息。因此，这些数据不能被认为是一个外在的人工制品，而是作为电影本身的属性。

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On the weak spot concept in the dielectric breakdown of thin polymer films

Films were prepared in a low-frequency (2.5-kHz) glow discharge diode system from hexamethyldisiloxane vapors at a pressure of 0.25 torr. Ramp and step tests were carried out to obtain voltage breakdown data. Statistical analysis of the weak-spot breakdown data shows that dielectric information can be extracted from their field functional dependence. As a consequence, these data cannot be considered as an extrinsic artefact but rather as a property of the film itself.<>

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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

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