薄膜光学传感器的建模与数据处理

Proceedings of the 6th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems Pub Date : 2011-11-10 DOI:10.1109/IDAACS.2011.6072723

T. Lebyedyeva, Yuriy Frolov, S. Kurlov, M. Budnyk, Y. Minov, P. Sutkovyi, P. Shpylovyi

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引用次数: 6

摘要

本文介绍了基于Al/Nb2O5薄膜结构的金属包层波导(MCWG)传感器和用于产生、处理和研究从介质和薄膜传感器衬底界面反射的光信号的角型“等离子体测试”传感器单元的开发结果。该装置可用于表面等离子体共振(SPR)和MCWG传感器。数据处理包括噪声抑制、数据插值、反射率曲线上最小值点的计算和它们随时间的角度位置生成(传感器图)。介绍了我们研制的MCWG Al/Nb2O5薄膜技术。为了验证等离子体测试和MCWG Al/Nb2O5传感器的性能，给出了折射测量的实验数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Modeling and data processing for thin-film optical sensors

The paper presents a results of the development of metal clad waveguide (MCWG) sensors on thin-film structures Al/Nb2O5 and a sensor unit of angular type “Plasmontest” which is intended to create, process, and study optical signal reflected from the interface of the medium and thin-film sensor substrate. The device can be used as surface plasmon resonance (SPR) and MCWG sensors. The data processing includes noise suppression, interpolation of data, calculation of the points of minimum on reflectivity curves and generation of their angular position from time (sensorogramm). Thin-film technology of MCWG Al/Nb2O5 developed by us is presented too. As a demonstration of the capabilities of “Plasmontest” and MCWG Al/Nb2O5 sensors the experimental date of refractometric measuring are presented.

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Proceedings of the 6th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems

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