{"title":"复杂目标近场电磁散射特性研究","authors":"Xiang Yingqing, Xu Peng-gen, Liu Wu","doi":"10.1109/CEEM.2000.853895","DOIUrl":null,"url":null,"abstract":"Calculation and analysis of the scattering near field from some simple and complex targets using a method of picture elements (PEL) and a computer program are discussed. The analysis is based upon a method of high-frequency approximation. The uniqueness of this method is derived from the simplicity of the theoretical basis such as the physical optics (PO) and the vector potential. The calculated results show that there are large differences between the near field and the far field. The characteristics of the near field are more complex. This work has practical engineering value in the area of the electromagnetic compatibility (EMC), electromagnetic interference (EMI) prediction and electromagnetic scattering.","PeriodicalId":153945,"journal":{"name":"Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation on the characteristics of the electromagnetic scattering near field from complex targets\",\"authors\":\"Xiang Yingqing, Xu Peng-gen, Liu Wu\",\"doi\":\"10.1109/CEEM.2000.853895\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Calculation and analysis of the scattering near field from some simple and complex targets using a method of picture elements (PEL) and a computer program are discussed. The analysis is based upon a method of high-frequency approximation. The uniqueness of this method is derived from the simplicity of the theoretical basis such as the physical optics (PO) and the vector potential. The calculated results show that there are large differences between the near field and the far field. The characteristics of the near field are more complex. This work has practical engineering value in the area of the electromagnetic compatibility (EMC), electromagnetic interference (EMI) prediction and electromagnetic scattering.\",\"PeriodicalId\":153945,\"journal\":{\"name\":\"Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEEM.2000.853895\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Asia-Pacific Conference on Environmental Electromagnetics. CEEM'2000 (IEEE Cat. No.00EX402)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEEM.2000.853895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation on the characteristics of the electromagnetic scattering near field from complex targets
Calculation and analysis of the scattering near field from some simple and complex targets using a method of picture elements (PEL) and a computer program are discussed. The analysis is based upon a method of high-frequency approximation. The uniqueness of this method is derived from the simplicity of the theoretical basis such as the physical optics (PO) and the vector potential. The calculated results show that there are large differences between the near field and the far field. The characteristics of the near field are more complex. This work has practical engineering value in the area of the electromagnetic compatibility (EMC), electromagnetic interference (EMI) prediction and electromagnetic scattering.