{"title":"12位200MS/s流水线sar ADC, 65nm CMOS, SNDR为61.9 dB","authors":"Haizhu Liu, Maliang Liu, Zhangming Zhu","doi":"10.1109/EDSSC.2019.8754022","DOIUrl":null,"url":null,"abstract":"This paper presents a 12-bit 200MS/s Pipelined-SAR hybrid architecture ADC with a 3.5-bit MDAC for the first stage and a 9-bit SAR ADC for the second stage. In the MDAC, a low-power high DC-gain class-AB residue amplifier is proposed to achieve 80dB DC-gain and 0.8GHz unity-gain-bandwidth (UGB). In the SAR ADC, two techniques are applied to accelerate the comparison speed to meet the requirement of high-speed ADC. Fabricated in a 65nm CMOS process, the ADC occupies an area of 0.21 mm2 and consumes a power of 7.3 mW. The measured Nyquist SFDR and SNDR are 71.2 dB and 61.9 dB at 200 MS/s. The ADC achieves a FoM of 35.6 fJ/conversion-step.","PeriodicalId":183887,"journal":{"name":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","volume":"169 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A 12-bit 200MS/s Pipelined-SAR ADC in 65-nm CMOS with 61.9 dB SNDR\",\"authors\":\"Haizhu Liu, Maliang Liu, Zhangming Zhu\",\"doi\":\"10.1109/EDSSC.2019.8754022\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a 12-bit 200MS/s Pipelined-SAR hybrid architecture ADC with a 3.5-bit MDAC for the first stage and a 9-bit SAR ADC for the second stage. In the MDAC, a low-power high DC-gain class-AB residue amplifier is proposed to achieve 80dB DC-gain and 0.8GHz unity-gain-bandwidth (UGB). In the SAR ADC, two techniques are applied to accelerate the comparison speed to meet the requirement of high-speed ADC. Fabricated in a 65nm CMOS process, the ADC occupies an area of 0.21 mm2 and consumes a power of 7.3 mW. The measured Nyquist SFDR and SNDR are 71.2 dB and 61.9 dB at 200 MS/s. The ADC achieves a FoM of 35.6 fJ/conversion-step.\",\"PeriodicalId\":183887,\"journal\":{\"name\":\"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"volume\":\"169 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDSSC.2019.8754022\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2019.8754022","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 12-bit 200MS/s Pipelined-SAR ADC in 65-nm CMOS with 61.9 dB SNDR
This paper presents a 12-bit 200MS/s Pipelined-SAR hybrid architecture ADC with a 3.5-bit MDAC for the first stage and a 9-bit SAR ADC for the second stage. In the MDAC, a low-power high DC-gain class-AB residue amplifier is proposed to achieve 80dB DC-gain and 0.8GHz unity-gain-bandwidth (UGB). In the SAR ADC, two techniques are applied to accelerate the comparison speed to meet the requirement of high-speed ADC. Fabricated in a 65nm CMOS process, the ADC occupies an area of 0.21 mm2 and consumes a power of 7.3 mW. The measured Nyquist SFDR and SNDR are 71.2 dB and 61.9 dB at 200 MS/s. The ADC achieves a FoM of 35.6 fJ/conversion-step.