{"title":"用于单级放大器的单点检测回转速率增强电路","authors":"Hoi Lee, P. Mok","doi":"10.1109/ISCAS.2002.1011482","DOIUrl":null,"url":null,"abstract":"Most slew rate enhancement circuits can either be used in current-mirror amplifiers or folded-cascode amplifiers, but not in both. In this paper, a new class of slew rate enhancement (SRE) circuits is proposed. By using a single-point detection (SPD) technique at the active load device of the core amplifier to sense the fast signal transient, the new SRE circuits can be used in both current-mirror and folded-cascode amplifiers. In addition, the simple SRE circuits serve as a plug-in feature to the core amplifier and do not affect its original small-signal frequency response. Implemented by an AMS 0.6 /spl mu/m CMOS process, the current-mirror amplifier with SRE circuit occupies an area of 0.027 mm/sup 2/ and achieves 1.5 V//spl mu/s slew rate with 470 pF capacitive load while only dissipating 90 /spl mu/A total static current. Similarly, the folded-cascode amplifier with SRE circuit occupies an area of 0.03 mm/sup 2/ and achieves 1.52 V//spl mu/s slew rate with 470 pF loading while only 84 /spl mu/A total static current is dissipated.","PeriodicalId":203750,"journal":{"name":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Single-point-detection slew-rate enhancement circuits for single-stage amplifiers\",\"authors\":\"Hoi Lee, P. Mok\",\"doi\":\"10.1109/ISCAS.2002.1011482\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Most slew rate enhancement circuits can either be used in current-mirror amplifiers or folded-cascode amplifiers, but not in both. In this paper, a new class of slew rate enhancement (SRE) circuits is proposed. By using a single-point detection (SPD) technique at the active load device of the core amplifier to sense the fast signal transient, the new SRE circuits can be used in both current-mirror and folded-cascode amplifiers. In addition, the simple SRE circuits serve as a plug-in feature to the core amplifier and do not affect its original small-signal frequency response. Implemented by an AMS 0.6 /spl mu/m CMOS process, the current-mirror amplifier with SRE circuit occupies an area of 0.027 mm/sup 2/ and achieves 1.5 V//spl mu/s slew rate with 470 pF capacitive load while only dissipating 90 /spl mu/A total static current. Similarly, the folded-cascode amplifier with SRE circuit occupies an area of 0.03 mm/sup 2/ and achieves 1.52 V//spl mu/s slew rate with 470 pF loading while only 84 /spl mu/A total static current is dissipated.\",\"PeriodicalId\":203750,\"journal\":{\"name\":\"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISCAS.2002.1011482\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2002.1011482","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single-point-detection slew-rate enhancement circuits for single-stage amplifiers
Most slew rate enhancement circuits can either be used in current-mirror amplifiers or folded-cascode amplifiers, but not in both. In this paper, a new class of slew rate enhancement (SRE) circuits is proposed. By using a single-point detection (SPD) technique at the active load device of the core amplifier to sense the fast signal transient, the new SRE circuits can be used in both current-mirror and folded-cascode amplifiers. In addition, the simple SRE circuits serve as a plug-in feature to the core amplifier and do not affect its original small-signal frequency response. Implemented by an AMS 0.6 /spl mu/m CMOS process, the current-mirror amplifier with SRE circuit occupies an area of 0.027 mm/sup 2/ and achieves 1.5 V//spl mu/s slew rate with 470 pF capacitive load while only dissipating 90 /spl mu/A total static current. Similarly, the folded-cascode amplifier with SRE circuit occupies an area of 0.03 mm/sup 2/ and achieves 1.52 V//spl mu/s slew rate with 470 pF loading while only 84 /spl mu/A total static current is dissipated.
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