纳米时代低功耗SRAM设计的挑战

Ruchi, S. Dasgupta
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引用次数: 0

摘要

技术进步要求每个设备具有更多的功能,同时由于技术缩放而减少了设备尺寸。SRAM由于其与逻辑的兼容性而代表了技术主力。更密集的SRAM是现代高性能的要求。由于工艺变化的影响越来越大,SRAM在低功耗状态下的稳定性需要引起人们的关注。这些变化是占主导地位的缩放设备。因此,整个SoC的可靠性主要受SRAM可靠性的影响。本文讨论了低功耗SRAM设计所面临的挑战,包括尺寸、功耗和工艺变化。讨论的结果是SRAM设计的挑战随着技术的扩展而增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Challenges of low power SRAM design in Nanoscale Era
Technology advancement demands more functionality per device with reducing device dimensions as a result of technology scaling. SRAM represents the technology workhorse due to its compatibility with the logic. The denser SRAM is the requirement for modern high performance. The stability of SRAM in low power regime needs attention due to increasing effects of process variations. These variations are dominant for the scaled devices. Therefore, the reliability of the overall SoC is mostly affected by the reliability of the SRAM. In this paper, the challenges to low-power SRAM design, based on the scaling, power dissipation, and process variations are discussed. The result of the discussion is that the challenges for SRAM designing increase with technology scaling.
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