硬件性能计数器,用于系统可靠性监控

E. Woo, Mark Zwolinski, Basel Halak
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引用次数: 15

摘要

随着技术规模达到纳米级,由于温度和电压变化、单事件效应和组件降解而导致的错误率增加,使组件的可靠性降低。为了确保系统在面对已知的可靠性问题时继续正常工作,系统必须具有检测由于故障存在而导致的错误发生的手段。正常运行的系统(系统中没有检测到错误)显示一个概要文件,任何与该概要文件的偏差都表明系统中存在异常。在本文中,我们建议使用硬件性能计数器(hpc)来测量程序执行期间发生的事件。我们探索了各种可用的计数器,这些计数器可用于识别系统中的异常行为,并开发了一种方法,通过创建无故障模式并观察该模式的任何后续变化来使用hpc观察异常。我们使用GemFI来评估所提出的技术,GemFI是一个基于Gem5的架构模拟器,具有额外的故障注入功能。我们将在执行结束时获得的结果与在一段时间间隔内收集的数据进行比较。我们的研究结果表明,hpc可以用于识别系统中可能导致故障的异常行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hardware performance counters for system reliability monitoring
As technology scaling reaches nanometre scales, the error rate due to variations in temperature and voltage, single event effects and component degradation increases, making components less reliable. In order to ensure a system continues to function correctly while facing known reliability issues, it is imperative that the system should have the means to detect the occurrence of errors due to the presence of faults. A system that behaves normally (no error detected in the system) exhibits a profile, and any deviations from this profile indicate that there is an anomaly in the system. In this paper, we propose to use hardware performance counters (HPCs) to measure events that occur during the execution of the program. We explore the various counters available which could be use to identify the anomalous behaviour in the system and develop a methodology to observe the anomalies using HPCs by creating a fault-free pattern and observing any subsequent changes in that pattern. We evaluate the proposed technique using GemFI, an architectural simulator based on Gem5 with additional fault injection capabilities. We compare the results obtained at the end of the execution with data collected during a time interval. Our results show that HPCs can be used to identify anomalous behaviour in a system that would lead to failure.
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