基于ASM-GaN紧凑模型的gan型DC-DC升压功率变换器硬开关特性研究

Dhawal Mahajan, S. Albahrani, Hossein Eslahi, S. Khandelwal
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引用次数: 2

摘要

本文采用ASM-GaN紧凑模型研究了基于GaN器件的DC-DC升压变换器的硬开关特性。ASM-GaN模型基于底层物理原理准确预测了关断状态输出电容损耗和I-V特性,从而预期地预测了功率晶体管开关损耗的动态特性。因此,这些模拟可以用来预测开关损耗,并进一步帮助在设计的初始阶段优化功率变换器的设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Study of Hard Switching Characteristics of GaN-based DC-DC Boost Power Converter using ASM-GaN Compact Model
This paper studies the hard switching characteristics of a DC-DC Boost converter based on GaN device using ASM-GaN compact model. The accurate prediction of OFF state output capacitance Coss and I-V characteristics based on underlying Physics by ASM-GaN model results in expected prediction of the dynamic character of switching losses across the power transistor. These simulations can thus be used to predict the switching losses and furthermore help in the optimization of power converter design during the initial phase of design.
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