{"title":"基于半桥结构的电力电子鲁棒超快速短路检测的杂散电压捕获:限制与实现","authors":"D. V. Retianza, J. van Duivenbode, H. Huisman","doi":"10.23919/EPE20ECCEEurope43536.2020.9215633","DOIUrl":null,"url":null,"abstract":"This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.","PeriodicalId":241752,"journal":{"name":"2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: the Limitation and Implementation\",\"authors\":\"D. V. Retianza, J. van Duivenbode, H. Huisman\",\"doi\":\"10.23919/EPE20ECCEEurope43536.2020.9215633\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.\",\"PeriodicalId\":241752,\"journal\":{\"name\":\"2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EPE20ECCEEurope43536.2020.9215633\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EPE20ECCEEurope43536.2020.9215633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stray Voltage Capture for Robust and Ultra-Fast Short Circuit Detection in Power Electronics with Half-Bridge Structure: the Limitation and Implementation
This paper proposes a robust and ultra-fast short circuit detection method based on the voltage dip on the half-bridge due to the presence of stray inductance. Results show that the short circuit is detected in less than 200ns, which is a promising solution against the Single-Event Burnout failure type occurrence.