优化成品率的稳健电路设计

2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) Pub Date : 2010-12-17 DOI:10.1109/SM2ACD.2010.5672315

C. Salzig, M. Hauser

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引用次数: 6

摘要

随着微电子技术向纳米电子技术的发展，对生产偏差的控制已经跟不上半导体器件绝对尺寸的缩小。这导致超出规格的电路数量增加。所提出的减少带有参数变化的行为模型的符号方法有助于设计和优化鲁棒电子电路，以提高所生产电路的成品率。

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Design of robust electronic circuits for yield optimization

With the trend from micro- to nanoelectronics the control of production deviations can not keep pace with the reduction of the absolute sizes of semiconductor devices. This results in an increased number of circuits beyond specification. The presented symbolic methods for reducing behavioral models with parameter variations assist designing and optimizing robust electronic circuits to increase the yield of produced circuits.

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2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD)

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