支持嵌入式缓存的sbst自动合成的统一形式

2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI:10.1109/EWDTS.2011.6116421

S. Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, P. Prinetto

{"title":"支持嵌入式缓存的sbst自动合成的统一形式","authors":"S. Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, P. Prinetto","doi":"10.1109/EWDTS.2011.6116421","DOIUrl":null,"url":null,"abstract":"The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.","PeriodicalId":339676,"journal":{"name":"2011 9th East-West Design & Test Symposium (EWDTS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A unifying formalism to support automated synthesis of SBSTs for embedded caches\",\"authors\":\"S. Carlo, Giulio Gambardella, Marco Indaco, Daniele Rolfo, P. Prinetto\",\"doi\":\"10.1109/EWDTS.2011.6116421\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.\",\"PeriodicalId\":339676,\"journal\":{\"name\":\"2011 9th East-West Design & Test Symposium (EWDTS)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 9th East-West Design & Test Symposium (EWDTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2011.6116421\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 9th East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2011.6116421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

本文提出了一种新的统一形式，以有效地支持用于数据和指令缓存的汇编测试程序的自动生成(基于软件的自测试)。特别是，新的形式允许描述目标内存、所选择的March Test算法，并且必须对其进行自定义以使其适应所选择的缓存。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A unifying formalism to support automated synthesis of SBSTs for embedded caches

The paper presents a new unifying formalism introduced to effectively support the automatic generation of assembly test programs to be used as SBST (Software Based Self-Testing) for both data and instruction cache memories. In particular, the new formalism allows the description of the target memory, of the selected March Test algorithm, and the way this has to be customize to adapt it to the selected cache.

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2011 9th East-West Design & Test Symposium (EWDTS)

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