{"title":"双极器件中单事件闭锁的观察","authors":"M. Shop, J. Gorelick, R. Rau, R. Kop, A. Martinez","doi":"10.1109/REDW.1993.700577","DOIUrl":null,"url":null,"abstract":"M. Shoga and J. Gorelick Hughes Space & Communication Company Los Angeles, CA 9OOO9","PeriodicalId":193714,"journal":{"name":"1993 IEEE Radiation Effects Data Workshop","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Observation Of Single Event Latchup In Bipolar Devices\",\"authors\":\"M. Shop, J. Gorelick, R. Rau, R. Kop, A. Martinez\",\"doi\":\"10.1109/REDW.1993.700577\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"M. Shoga and J. Gorelick Hughes Space & Communication Company Los Angeles, CA 9OOO9\",\"PeriodicalId\":193714,\"journal\":{\"name\":\"1993 IEEE Radiation Effects Data Workshop\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-07-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1993 IEEE Radiation Effects Data Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1993.700577\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1993.700577","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
摘要
M. Shoga和J. Gorelick Hughes空间与通信公司洛杉矶，加利福尼亚州199009
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