{"title":"基于距离的测试集缩减,用于有效的基于测试的故障定位","authors":"Xingya Wang, Shujuan Jiang, Pengfei Gao, Xiaolin Ju, Rongcun Wang, Yanmei Zhang","doi":"10.1109/SATE.2016.21","DOIUrl":null,"url":null,"abstract":"Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.","PeriodicalId":344531,"journal":{"name":"2016 International Conference on Software Analysis, Testing and Evolution (SATE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Distance-Based Test-Suite Reduction for Efficient Testing-Based Fault Localization\",\"authors\":\"Xingya Wang, Shujuan Jiang, Pengfei Gao, Xiaolin Ju, Rongcun Wang, Yanmei Zhang\",\"doi\":\"10.1109/SATE.2016.21\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.\",\"PeriodicalId\":344531,\"journal\":{\"name\":\"2016 International Conference on Software Analysis, Testing and Evolution (SATE)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Software Analysis, Testing and Evolution (SATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SATE.2016.21\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Software Analysis, Testing and Evolution (SATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SATE.2016.21","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Distance-Based Test-Suite Reduction for Efficient Testing-Based Fault Localization
Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.