基于距离的测试集缩减,用于有效的基于测试的故障定位

Xingya Wang, Shujuan Jiang, Pengfei Gao, Xiaolin Ju, Rongcun Wang, Yanmei Zhang
{"title":"基于距离的测试集缩减,用于有效的基于测试的故障定位","authors":"Xingya Wang, Shujuan Jiang, Pengfei Gao, Xiaolin Ju, Rongcun Wang, Yanmei Zhang","doi":"10.1109/SATE.2016.21","DOIUrl":null,"url":null,"abstract":"Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.","PeriodicalId":344531,"journal":{"name":"2016 International Conference on Software Analysis, Testing and Evolution (SATE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Distance-Based Test-Suite Reduction for Efficient Testing-Based Fault Localization\",\"authors\":\"Xingya Wang, Shujuan Jiang, Pengfei Gao, Xiaolin Ju, Rongcun Wang, Yanmei Zhang\",\"doi\":\"10.1109/SATE.2016.21\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.\",\"PeriodicalId\":344531,\"journal\":{\"name\":\"2016 International Conference on Software Analysis, Testing and Evolution (SATE)\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Software Analysis, Testing and Evolution (SATE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SATE.2016.21\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Software Analysis, Testing and Evolution (SATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SATE.2016.21","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

基于测试的故障定位(TBFL)可以通过向开发人员提供可疑语句的排序列表来指导和自动化程序调试过程。然而,收集整个原始测试套件的测试信息对于开发人员进行有效的TBFL来说总是过于昂贵甚至不可行的。传统的测试套件缩减(TSR)方法可以用来减少测试套件的大小。但是它们仍然依赖于整个测试信息收集的耗时过程。在本文中,我们提出了一种基于距离的测试套件缩减(DTSR)方法。在执行测试套件缩减时,它是由测试用例之间的距离而不是整个测试信息来指导的。与现有的tsr相比,DTSR只需要收集一部分测试用例的测试信息。我们对一系列基准测试的调查表明,DTSR可以有效地减少给定测试套件的大小和TBFL的时间成本。尽管如此,我们的方法的故障定位有效性接近于整个测试套件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Distance-Based Test-Suite Reduction for Efficient Testing-Based Fault Localization
Testing-based Fault Localization (TBFL) can guide and automate the process of program debugging by providing developers with a ranked list of suspicious statements. However, collecting the testing information of the whole original test-suite is always too expensive or even infeasible for developers to conduct efficient TBFL. Traditional Test-Suite Reduction (TSR) approaches can be utilized to reduce the size of test-suite. But they still rely on the time-consuming process of the whole testing information collection. In this paper, we propose a distance-based test-suite reduction (DTSR) approach. It is guided by the distances between the test cases rather than the whole testing information when conducting the test-suite reduction. Compared with the existing TSRs, DTSR only needs to collect the testing information of a part of test cases. Our investigation on a series of benchmarks shows that DTSR can effectively reduce the size of the given test-suite and the time cost of TBFL. Nerveless, the fault localization effective-ness of our approach is close to that of the whole test-suite.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信