{"title":"一种用于火灾探测的全mos混合模拟数字电路","authors":"D. Barbier, R. Poujois, J. Borel","doi":"10.1109/ESSCIRC.1980.5468783","DOIUrl":null,"url":null,"abstract":"MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.","PeriodicalId":168272,"journal":{"name":"ESSCIRC 80: 6th European Solid State Circuits Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An All-MOS Mixed Analog and Digital Circuit for Fire Detection\",\"authors\":\"D. Barbier, R. Poujois, J. Borel\",\"doi\":\"10.1109/ESSCIRC.1980.5468783\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.\",\"PeriodicalId\":168272,\"journal\":{\"name\":\"ESSCIRC 80: 6th European Solid State Circuits Conference\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1980-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 80: 6th European Solid State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1980.5468783\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 80: 6th European Solid State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1980.5468783","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An All-MOS Mixed Analog and Digital Circuit for Fire Detection
MOS technology allows to make on the same chip analog and digital functions provided the analog functions can be realized in standard technology. This is the case for an all-MOS P channel Al gate fire detector chip where temperature rise or smoke density rise (signal from an ionization chamber) provide an alarm signal. Maximum values of these parameters are also detected. Self testing on chip is made for indicating a malfunctioning of the chip.
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