热刺激电流中带电中心的影响:在聚n -乙烯基咔唑上的应用

J. Plans, M. Zieliński
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引用次数: 0

摘要

在测量非晶介质中直流电导率的场依赖性时,人们经常发现,绘制的电流的对数与电场的平方根产生一条直线。这种效应可能是由于在外部场的影响下,空时带电的陷阱的占领概率降低。Frenkel和Poole(1)从与带电中心的库仑相互作用的角度讨论了这一现象。然而,电极注入(肖特基效应(2))可以产生相同类型的场依赖,并且通常很难区分这两种现象。最近,在机动性的飞行时间测量中发现了相同类型的场依赖性。这种效应现在被认为是如此广泛,以至于有人怀疑非晶介质中带电阱的存在是否仅仅是这些材料中各种电性能的场依赖性的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The effect of charged centers in thermally stimulated currents: Application to poly(N-vinylcarbazole)
In measuring the field dependence of DC conductivity in amorphous dielectrics one often finds, that the logarithm of current plotted vs. square root of electric field yields a straight line. This effect may be due to decrease of occupation probability of a trap, charged when empty, under the influence of the external field. Frenkel and Poole (1) discussed this phenomenon in terms of the Coulomb interactions with the charged center. The electrode injection (Schottky effect (2)) can, however, yield the same type of field dependence, and it is often very difficult to distinguish both phenomena. More recently, the same type of field dependence was found in the time-of-flight measurements of mobility. This effect is now seen to be so widespread that doubts have been raised whether the presence of charged traps in amorphous dielectrics solely accounts for the observed field dependence of various electrical properties in these materials.
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