TRL校准套件的设计、仿真和表征

G. Merletti, Andrés Altieri
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引用次数: 0

摘要

在微波系统的开发中,能够以最小的误差隔离地表征器件和组件是很重要的。在这种情况下,TRL(透反射线)校准技术是一种通用工具,它允许提取双端口网络的S参数,最大限度地减少测量电路和设备安装的寄生效应。本工作介绍了在低成本FR4基板上使用微带线实现的TRL校准套件的设计,仿真和测量。利用所设计的工具提取电容器的S参数,并将模拟结果与实测结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Diseño, simulación y caracterización de un kit decalibración TRL
In the development of microwave systems it is important to be able to characterize devices and components in isolation with the least error possible. In this context, TRL (Through-Reflect-Line) calibration techniques are a versatile tool which allows to extract the S parameters of a two-port network minimizing the parasitic effects of measurement circuitry and device mounting. This work presents the design, simulation and measurement of a TRL calibration kit implemented using microstrip lines in a low-cost FR4 substrate. The designed kit is used to extract the S parameters of a capacitor, comparing the simulations with the obtained measurements.
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