{"title":"液体薄膜的微波表征","authors":"K. P. Roy, J. Ku, I. Kaufman, S. Kalra","doi":"10.1109/MWSYM.1985.1131936","DOIUrl":null,"url":null,"abstract":"A simple microwave technique is described that measures the instantaneous local thickness of a film of liquid flowing down the inner wall of a tube while at the same time a cnrrent of gas flows in the opposite direction. Such a measurement technique is significant because of the extensive occurrence of such liquid/gas flows in chemical process and energy industries.","PeriodicalId":446741,"journal":{"name":"1985 IEEE MTT-S International Microwave Symposium Digest","volume":"222 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microwave Characterization of Liquid Films\",\"authors\":\"K. P. Roy, J. Ku, I. Kaufman, S. Kalra\",\"doi\":\"10.1109/MWSYM.1985.1131936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple microwave technique is described that measures the instantaneous local thickness of a film of liquid flowing down the inner wall of a tube while at the same time a cnrrent of gas flows in the opposite direction. Such a measurement technique is significant because of the extensive occurrence of such liquid/gas flows in chemical process and energy industries.\",\"PeriodicalId\":446741,\"journal\":{\"name\":\"1985 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"222 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1985 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1985.1131936\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1985.1131936","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simple microwave technique is described that measures the instantaneous local thickness of a film of liquid flowing down the inner wall of a tube while at the same time a cnrrent of gas flows in the opposite direction. Such a measurement technique is significant because of the extensive occurrence of such liquid/gas flows in chemical process and energy industries.
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