Mingqi Jiang, W. Tang, Evangeline F. Y. Young, Y. L. Wu
{"title":"重新布线重新计时自由触发器减少没有延迟惩罚","authors":"Mingqi Jiang, W. Tang, Evangeline F. Y. Young, Y. L. Wu","doi":"10.1109/VDAT.2009.5158123","DOIUrl":null,"url":null,"abstract":"Due to the intrinsic difference between fan-in and fan-out counts of a retimed component, the number of flip-flops tends to be undesirably increased in a conventional retiming procedure, which can cause a significant area/power penalty on the retimed circuit. Nonetheless, because of the higher dominance on interconnect delays, without a mechanism to reflect real physical design accurately, the clock period produced by a retiming scheme will be unrealistic. To overcome these two major drawbacks of the conventional retiming technique, we propose a novel retiming flow combined with rewiring, being able to largely cut down flip-flops (FFs) while with the original retimed clock period uncompromised. For a more accurate delay estimation, all interconnect delays are formulated and calculated based on real placements. Experimental results show that this novel rewired retiming scheme can bring a reduction of 18.7% (on average) on the number of flip-flops compared to the original retiming without rewiring. This large FF reduction can be considered a free gain as the retimed clock period can still be kept without compromise in such flow. Further experiments have indicated that about 8.26% of the total dynamic power can be saved.","PeriodicalId":246670,"journal":{"name":"2009 International Symposium on VLSI Design, Automation and Test","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Rewired retiming for free flip-flop reductions without delay penalty\",\"authors\":\"Mingqi Jiang, W. Tang, Evangeline F. Y. Young, Y. L. Wu\",\"doi\":\"10.1109/VDAT.2009.5158123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to the intrinsic difference between fan-in and fan-out counts of a retimed component, the number of flip-flops tends to be undesirably increased in a conventional retiming procedure, which can cause a significant area/power penalty on the retimed circuit. Nonetheless, because of the higher dominance on interconnect delays, without a mechanism to reflect real physical design accurately, the clock period produced by a retiming scheme will be unrealistic. To overcome these two major drawbacks of the conventional retiming technique, we propose a novel retiming flow combined with rewiring, being able to largely cut down flip-flops (FFs) while with the original retimed clock period uncompromised. For a more accurate delay estimation, all interconnect delays are formulated and calculated based on real placements. Experimental results show that this novel rewired retiming scheme can bring a reduction of 18.7% (on average) on the number of flip-flops compared to the original retiming without rewiring. This large FF reduction can be considered a free gain as the retimed clock period can still be kept without compromise in such flow. Further experiments have indicated that about 8.26% of the total dynamic power can be saved.\",\"PeriodicalId\":246670,\"journal\":{\"name\":\"2009 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2009.5158123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2009.5158123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Rewired retiming for free flip-flop reductions without delay penalty
Due to the intrinsic difference between fan-in and fan-out counts of a retimed component, the number of flip-flops tends to be undesirably increased in a conventional retiming procedure, which can cause a significant area/power penalty on the retimed circuit. Nonetheless, because of the higher dominance on interconnect delays, without a mechanism to reflect real physical design accurately, the clock period produced by a retiming scheme will be unrealistic. To overcome these two major drawbacks of the conventional retiming technique, we propose a novel retiming flow combined with rewiring, being able to largely cut down flip-flops (FFs) while with the original retimed clock period uncompromised. For a more accurate delay estimation, all interconnect delays are formulated and calculated based on real placements. Experimental results show that this novel rewired retiming scheme can bring a reduction of 18.7% (on average) on the number of flip-flops compared to the original retiming without rewiring. This large FF reduction can be considered a free gain as the retimed clock period can still be kept without compromise in such flow. Further experiments have indicated that about 8.26% of the total dynamic power can be saved.