散热器应用和PCB设计变化对BGA焊点可靠性的影响

O. Ahmed, Leif Hutchinson, P. Su, Tengfei Jiang
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引用次数: 1

摘要

对先进半导体设备(如网络处理器)不断增长的性能需求推动了这些设备的体积、复杂性和功耗的持续增长。对于热管理,可能需要新的热界面材料,其中一些材料需要更高的压力才能达到所需的热性能。在印刷电路板方面,新系统的层数和厚度都在增加,也需要新一代的材料。所有这些因素对焊点可靠性提出了新的挑战,疲劳寿命模型需要新的评估和验证。在这项工作中,我们使用有限元模拟来研究和关联多种配置下近产品设计中焊点的可靠性性能。在第一种配置中,评估了散热器负载的影响。分析焊点阵列中的应变和应力分布。结果将用于解释两种配置的实际测试结果,一种有散热器,另一种没有。其次,对同一电气性能组的PCB材料进行评估。相同的组件安装在三种布局相同的PCB材料上,所有组件都采用相同的温度循环测试。将讨论寿命差异,并与仿真结果进行比较。最后,将以类似的方式评估PCB厚度的影响,其中测试和比较两种厚度,再次使用相同的组件测试车辆和加速测试条件。这些研究的结果将为一些最具挑战性的应用条件下的焊点可靠性提供现实的评估,并且对改进现场寿命模型非常重要。对于组件和系统鉴定,这些数据还将有助于确定重要的重点领域,以确保正确执行鉴定测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effects of Heatsink Application and PCB Design Variations on BGA Solder Joint Reliability
The ever-increasing performance demand on advanced semiconductor devices such as networking processors has been driving the continued growth of body size, complexity, and power consumption of these devices. For thermal management, new thermal interface materials may be needed and some of these materials require higher pressure to achieve the desired thermal performance. On the printed circuit board side, both layer count and thickness are increasing for new systems and a new generation of materials is also needed. All of these factors pose new challenges to solder joint reliability and the fatigue life models require fresh assessment and validation. In this work, we use finite element simulation to investigate and correlate the reliability performance of solder joints in near-product designs in multiple configurations. In the first configuration, the effects of heatsink loading are evaluated. Strain and stress distribution in the solder joints arrays will be analyzed. The results will be used to interpret real-life testing results from both configurations, one with heatsink and one without. Secondly, PCB materials from the same electrical performance group are evaluated. The same component is mounted on three PCB materials with identical layout and all assemblies are tested with the same temperature cycling test. Lifetime differences will be discussed and compared with simulation results. Lastly, effects of PCB thickness will be evaluated in a similar fashion where two thicknesses are tested and compared, again using the same component test vehicle and acceleration testing condition. Results from these studies will provide realistic assessment of solder joint reliability in some of the most challenging application conditions and will be important for improving field lifetime models. For component and system qualification, these data will also help identify important areas of focus to ensure qualification tests are properly executed.
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