微处理器功能测试策略

[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory Pub Date : 1990-03-11 DOI:10.1109/SSST.1990.138184

A. Noore, B.E. Weinrich

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引用次数: 1

摘要

提出了一种有效的微处理器测试生成策略。提出了模块化块、综合指令集和微指令集方法。这些实用的方法是详尽测试的可行替代方案，详尽测试旨在考虑所有可能的指令、寻址模式和数据模式。所提出的方法是通用和有效的，特别是在用户环境中

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Strategies for functional testing of microprocessors

Effective strategies for generating tests for microprocessors are presented. Modular block, comprehensive instruction set, and microinstruction set approaches are proposed. These practical approaches are viable alternatives to the exhaustive testing which aims at considering all possible instructions, addressing modes and data patterns. The proposed approaches are versatile and effective, especially in the user environment.<>

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[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory

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