{"title":"在TPS重新主机项目中替换遗留模拟仪器的挑战","authors":"Y. Eracar, Thomas Jacobs","doi":"10.1109/AUTEST.2018.8532542","DOIUrl":null,"url":null,"abstract":"This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"124 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Challenges of Replacing Legacy Analog Instrumentation During TPS Rehost Projects\",\"authors\":\"Y. Eracar, Thomas Jacobs\",\"doi\":\"10.1109/AUTEST.2018.8532542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.\",\"PeriodicalId\":384058,\"journal\":{\"name\":\"2018 IEEE AUTOTESTCON\",\"volume\":\"124 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2018.8532542\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Challenges of Replacing Legacy Analog Instrumentation During TPS Rehost Projects
This paper starts with a brief overview of Test Program Set (TPS) life cycle and explains TPS maintenance (and/or re-host) issues that come with long-term support requirements. The focus of the paper is the compatibility issues found between the legacy and the replacement analog instrumentation during two recent TPS re-host projects. A detailed analysis is provided for the compatibility issues and the applied solutions from the perspective of both the TPS developer and the analog instrument vendor. The paper is concluded with a section on possible approaches to design a new analog instrument that needs to replace a legacy instrument without sacrificing from the features necessary for modern test requirements.
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