{"title":"面向自我健康管理的容错可穿戴计算系统架构","authors":"Reshmi Mitra, B. Joshi, A. Mukherjee","doi":"10.1109/EIT.2008.4554327","DOIUrl":null,"url":null,"abstract":"One of the most important applications of wearable computing or smart textiles is biomedical monitoring for self-health management. In this paper Constraint Satisfaction Problem (CSP) for smart textiles is defined. The goal is an optimized fault tolerant on-body sensor network. A novel event-driven architecture for smart textiles is proposed. A correlation between the architecture and the design features is established for optimized signal collection, fault tolerance and simplified interconnects. As part of the reliability analysis, this work proceeds to present the description of faults. Then a suitable fault model is defined supporting the defect distribution. Finally, the simulator based on Mealy machines was designed to correlate all the features defined during the course of work. In the end, the proposed architecture has shown significant improvement in terms of highest path reliability over a simplistic system with a single data collecting point.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Fault-tolerant wearable computing system architecture for self-health management\",\"authors\":\"Reshmi Mitra, B. Joshi, A. Mukherjee\",\"doi\":\"10.1109/EIT.2008.4554327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"One of the most important applications of wearable computing or smart textiles is biomedical monitoring for self-health management. In this paper Constraint Satisfaction Problem (CSP) for smart textiles is defined. The goal is an optimized fault tolerant on-body sensor network. A novel event-driven architecture for smart textiles is proposed. A correlation between the architecture and the design features is established for optimized signal collection, fault tolerance and simplified interconnects. As part of the reliability analysis, this work proceeds to present the description of faults. Then a suitable fault model is defined supporting the defect distribution. Finally, the simulator based on Mealy machines was designed to correlate all the features defined during the course of work. In the end, the proposed architecture has shown significant improvement in terms of highest path reliability over a simplistic system with a single data collecting point.\",\"PeriodicalId\":215400,\"journal\":{\"name\":\"2008 IEEE International Conference on Electro/Information Technology\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Conference on Electro/Information Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIT.2008.4554327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Electro/Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIT.2008.4554327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault-tolerant wearable computing system architecture for self-health management
One of the most important applications of wearable computing or smart textiles is biomedical monitoring for self-health management. In this paper Constraint Satisfaction Problem (CSP) for smart textiles is defined. The goal is an optimized fault tolerant on-body sensor network. A novel event-driven architecture for smart textiles is proposed. A correlation between the architecture and the design features is established for optimized signal collection, fault tolerance and simplified interconnects. As part of the reliability analysis, this work proceeds to present the description of faults. Then a suitable fault model is defined supporting the defect distribution. Finally, the simulator based on Mealy machines was designed to correlate all the features defined during the course of work. In the end, the proposed architecture has shown significant improvement in terms of highest path reliability over a simplistic system with a single data collecting point.