时间交错SAR adc的采样时钟偏差校正技术

D. Prashanth, Hae-Seung Lee
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引用次数: 3

摘要

提出了一种通过调整时间交错(TI) ADC中各通道输入信号的延迟来校正采样时钟偏差的技术。采用该技术的概念验证型TI ADC已在65纳米CMOS工艺中实现。该四路TI ADC的有效采样率为150 MS/s,在输入信号频率分别为2.1 MHz和74.1 MHz时,SNDR分别为60.2 dB和58.2 dB。ADC的功耗为12.4 mW,电源电压为1.2 V,面积为0.9 mm2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A sampling clock skew correction technique for time-interleaved SAR ADCs
A technique for sampling clock skew correction by adjusting the delay in the input signal to each channel in a time-interleaved (TI) ADC is proposed. A proof-of-concept TI ADC employing this technique was implemented in a 65 nm CMOS process. The four-way TI ADC operates at an effective sampling rate of 150 MS/s, and achieves 60.2 dB and 58.2 dB SNDR for an input signal frequency of 2.1 MHz and 74.1 MHz, respectively. The ADC consumes 12.4 mW from a 1.2 V supply and occupies an area of 0.9 mm2.
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