{"title":"单焊点界面动态断裂的粘结区模拟","authors":"F. Gao, J. Jing, F. Liang, R. L. Williams, J. Qu","doi":"10.1109/ESIME.2009.4938512","DOIUrl":null,"url":null,"abstract":"The interfacial failure behavior of a single solder joint is investigated under the pure tensile or shear loading at 5 mm/s. The brittel failure is detected for the specimen under pure tension loading, while a ductile failure is found after pure shear loading. A cohesive zone model is employed herein to explore the dynamic fracture behavior at the solder/IMC and IMC/Cu pad interfaces. The simulated results show that these two interfaces possess different mechanical properties. Under pure tensile loading at 5 mm/s, the damage typically starts at the edge of the solder/IMC interface, while the crack is eventually generated and propagated at the IMC/Cu pad interface, which corresponds to a typical brittle interfacial failure.","PeriodicalId":225582,"journal":{"name":"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"202 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Cohesive zone simulation on dynamic fracture at the interfaces of a single solder joint\",\"authors\":\"F. Gao, J. Jing, F. Liang, R. L. Williams, J. Qu\",\"doi\":\"10.1109/ESIME.2009.4938512\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The interfacial failure behavior of a single solder joint is investigated under the pure tensile or shear loading at 5 mm/s. The brittel failure is detected for the specimen under pure tension loading, while a ductile failure is found after pure shear loading. A cohesive zone model is employed herein to explore the dynamic fracture behavior at the solder/IMC and IMC/Cu pad interfaces. The simulated results show that these two interfaces possess different mechanical properties. Under pure tensile loading at 5 mm/s, the damage typically starts at the edge of the solder/IMC interface, while the crack is eventually generated and propagated at the IMC/Cu pad interface, which corresponds to a typical brittle interfacial failure.\",\"PeriodicalId\":225582,\"journal\":{\"name\":\"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"volume\":\"202 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2009.4938512\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"EuroSimE 2009 - 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2009.4938512","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cohesive zone simulation on dynamic fracture at the interfaces of a single solder joint
The interfacial failure behavior of a single solder joint is investigated under the pure tensile or shear loading at 5 mm/s. The brittel failure is detected for the specimen under pure tension loading, while a ductile failure is found after pure shear loading. A cohesive zone model is employed herein to explore the dynamic fracture behavior at the solder/IMC and IMC/Cu pad interfaces. The simulated results show that these two interfaces possess different mechanical properties. Under pure tensile loading at 5 mm/s, the damage typically starts at the edge of the solder/IMC interface, while the crack is eventually generated and propagated at the IMC/Cu pad interface, which corresponds to a typical brittle interfacial failure.