柔性装置跌落试验仿真研究

Q. Chen, Leon Xu, Cherie Jing, Tom Xue, Bin Wang, Tiejun Zhao, A. Salo, K. Ojala
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引用次数: 0

摘要

本文选择腕式装置概念,通过跌落试验仿真研究柔性装置的可靠性。在概念装置中,所有的部件不可能立即变得灵活。其中一些仍然是刚性的,如球栅阵列(BGA),连接器和其他一些大型组件,如振动器。这种设备的可靠性是无法保证的,因为这种刚性组件安装在柔性塑料基板上。在本研究中,建立了一个跌落试验的系统级仿真模型。在该仿真模型中,存在装配产品初始形状不确定、冲击时间长、新材料力学行为未知等挑战。为了解决这些问题,进行了一些手工工作和一些模型简化。对于柔性装置,可靠性研究主要集中在电气连接和装配过程。在建立模型之前,首先对该装置进行了结构分析。在此分析的基础上,确定了一些潜在的关注点。在此基础上,细化了显示、BGA焊点和柔性印刷电路(FPC)铜迹等子模型。在不同的落点方向下进行了7次落点模拟。有六个基本的正交跌落方向和一个额外的跌落方向,预计会对设备的可靠性产生严重影响。通过模拟,通过对跌落试验中Von Mises应力水平的观察,指出了一些薄弱环节。结果提供给电子和机械设计人员作为新设计的参考,并采取了一些措施来优化设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Drop test simulation study of flexible devices
In this paper, a wrist device conception was selected to study the reliability of flexible devices by drop test simulation. In the conception device, all of the components cannot be made flexible immediately. Some of them are still rigid, such as the Ball Grid Array (BGA), the connector, and some other big components like the vibrator. The reliability of the device, where such rigid components are mounted on a flexible plastic substrate, is anything but guaranteed. In this study, a system level simulation model of a drop test was developed. In this simulation model, there are some challenges, such as the uncertain initial shape of the assembled products, the long impact time, and the unknown mechanical behaviours of new materials. To solve these problems, some manual work and some model simplification were performed. For the flexible device, the reliability study focussed on the electrical connection and the assembly processes. Before building the model, structural analysis of this device had been carried out first. Based on this analysis, some points of potential concern were identified. Based on these points, several submodels were refined such as the display, the BGA solder joint, and the Flexible Printed Circuit (FPC) copper trace. Seven drop simulations had been executed with different drop directions. There were six basic orthogonal drop directions and one additional drop direction, that was anticipated to have a serious impact on the reliability of the device. Through the simulations, some weak locations were pointed out by the observation of the stress level of Von Mises in the drop test. The results were delivered to the electronical and mechanical designer for reference in the new design and some actions were taken to optimize the design.
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