用于锁相环应用的高速CMOS电荷泵电路采用90nm CMOS技术

Jyoti Gupta, A. Sangal, Hemlata Verma
{"title":"用于锁相环应用的高速CMOS电荷泵电路采用90nm CMOS技术","authors":"Jyoti Gupta, A. Sangal, Hemlata Verma","doi":"10.1109/WICT.2011.6141270","DOIUrl":null,"url":null,"abstract":"The performance of charge pumps depends heavily on the ability to efficiently generate high voltages on-chip while meeting stringent power and area requirements. The paper presents a High Speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology that operates at 1V. The proposed circuit has simple symmetric structure and provides more stable operation while reducing spurious jump phenomenon. The experimental result shows significant improvement in overcoming the problem of jitter. The output voltage of presented design can be increased up to 1010mV. The functionality of charge pump has been tested at operating based frequency of 1000 MHz.","PeriodicalId":178645,"journal":{"name":"2011 World Congress on Information and Communication Technologies","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"High speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology\",\"authors\":\"Jyoti Gupta, A. Sangal, Hemlata Verma\",\"doi\":\"10.1109/WICT.2011.6141270\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The performance of charge pumps depends heavily on the ability to efficiently generate high voltages on-chip while meeting stringent power and area requirements. The paper presents a High Speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology that operates at 1V. The proposed circuit has simple symmetric structure and provides more stable operation while reducing spurious jump phenomenon. The experimental result shows significant improvement in overcoming the problem of jitter. The output voltage of presented design can be increased up to 1010mV. The functionality of charge pump has been tested at operating based frequency of 1000 MHz.\",\"PeriodicalId\":178645,\"journal\":{\"name\":\"2011 World Congress on Information and Communication Technologies\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 World Congress on Information and Communication Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WICT.2011.6141270\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 World Congress on Information and Communication Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WICT.2011.6141270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

电荷泵的性能在很大程度上取决于能否有效地在芯片上产生高电压,同时满足严格的功率和面积要求。本文提出了一种用于锁相环应用的高速CMOS电荷泵电路,该电路采用90nm CMOS技术,工作电压为1V。该电路具有简单的对称结构,在减少杂散跳变现象的同时提供了更稳定的工作。实验结果表明,该方法在克服抖动问题方面有明显的改善。本设计可将输出电压提高到1010mV。在1000兆赫的工作频率下对电荷泵的功能进行了测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology
The performance of charge pumps depends heavily on the ability to efficiently generate high voltages on-chip while meeting stringent power and area requirements. The paper presents a High Speed CMOS charge pump circuit for PLL applications using 90nm CMOS technology that operates at 1V. The proposed circuit has simple symmetric structure and provides more stable operation while reducing spurious jump phenomenon. The experimental result shows significant improvement in overcoming the problem of jitter. The output voltage of presented design can be increased up to 1010mV. The functionality of charge pump has been tested at operating based frequency of 1000 MHz.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信