{"title":"用多波长干涉法测量小型光学器件","authors":"M. Wendel","doi":"10.1117/12.2542914","DOIUrl":null,"url":null,"abstract":"A new approach for measurement of small and thin lenses is introduced, based on the combination of long and short coherence interferometrical point probe systems in one measurement device. The basic working principle, as well as first results, are presented, and the benefits of this approach are highlighted.","PeriodicalId":112965,"journal":{"name":"Optical Angular Momentum","volume":"114 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement of small optics by use of a multi-wavelength interferometrical approach\",\"authors\":\"M. Wendel\",\"doi\":\"10.1117/12.2542914\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new approach for measurement of small and thin lenses is introduced, based on the combination of long and short coherence interferometrical point probe systems in one measurement device. The basic working principle, as well as first results, are presented, and the benefits of this approach are highlighted.\",\"PeriodicalId\":112965,\"journal\":{\"name\":\"Optical Angular Momentum\",\"volume\":\"114 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Angular Momentum\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2542914\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Angular Momentum","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2542914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of small optics by use of a multi-wavelength interferometrical approach
A new approach for measurement of small and thin lenses is introduced, based on the combination of long and short coherence interferometrical point probe systems in one measurement device. The basic working principle, as well as first results, are presented, and the benefits of this approach are highlighted.