{"title":"基于椭圆轮廓分布模型和算子反馈的高级高光谱检测","authors":"A. Schaum","doi":"10.1109/AIPR.2009.5466308","DOIUrl":null,"url":null,"abstract":"In autonomous hyperspectral remote sensing systems, the physical causes of false alarms are not all understood. Some arise from vagaries in sensor performance, especially in non-visible wavelengths. Consequently, many false target declarations are characterized simply as outliers, anomalies conforming to no physical or statistical models. Other false alarms arise from clutter spectra too similar to target spectra. To eliminate the recurrence of such difficult errors, deployed systems should allow operator feedback to their signal processing systems. Here we describe how a hyperspectral system using even advanced detection algorithms, based on a elliptically contoured distribution models, can be enhanced by allowing it to learn from its mistakes.","PeriodicalId":266025,"journal":{"name":"2009 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2009)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Advanced hyperspectral detection based on elliptically contoured distribution models and operator feedback\",\"authors\":\"A. Schaum\",\"doi\":\"10.1109/AIPR.2009.5466308\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In autonomous hyperspectral remote sensing systems, the physical causes of false alarms are not all understood. Some arise from vagaries in sensor performance, especially in non-visible wavelengths. Consequently, many false target declarations are characterized simply as outliers, anomalies conforming to no physical or statistical models. Other false alarms arise from clutter spectra too similar to target spectra. To eliminate the recurrence of such difficult errors, deployed systems should allow operator feedback to their signal processing systems. Here we describe how a hyperspectral system using even advanced detection algorithms, based on a elliptically contoured distribution models, can be enhanced by allowing it to learn from its mistakes.\",\"PeriodicalId\":266025,\"journal\":{\"name\":\"2009 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2009)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2009)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIPR.2009.5466308\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2009)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIPR.2009.5466308","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Advanced hyperspectral detection based on elliptically contoured distribution models and operator feedback
In autonomous hyperspectral remote sensing systems, the physical causes of false alarms are not all understood. Some arise from vagaries in sensor performance, especially in non-visible wavelengths. Consequently, many false target declarations are characterized simply as outliers, anomalies conforming to no physical or statistical models. Other false alarms arise from clutter spectra too similar to target spectra. To eliminate the recurrence of such difficult errors, deployed systems should allow operator feedback to their signal processing systems. Here we describe how a hyperspectral system using even advanced detection algorithms, based on a elliptically contoured distribution models, can be enhanced by allowing it to learn from its mistakes.