利用互相关技术寻找激光测微仪扫描数据的相似性

J. Czebe, P. Šuránek, J. Tůma, D. Fojtik
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引用次数: 0

摘要

本文演示了一种信号处理方法,设计用于覆盖使用两个光学微米测量的数据集。为了测量物体的形状,使用了两个传感器,但是测量的信号是相对移位的,因为不可能将传感器安装在相同的位置。将相关方法应用于测量数据,并评估了这些数据集之间的位移。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FINDING SIMILARITIES IN LASER MICROMETERS‘ SCANNED DATA USING CROSS-CORRELATION
This paper demonstrates a signal processing approach designed to overlay data sets measured using two optical micrometers. Two sensors are used in order to measure object’s shape, but measured signals are relatively shifted, because it is impossible to mount sensors into the same position. Correlation method are applied to measurement data and the shift between these sets are evaluated.
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