增强型GaN场效应管的dv/dt瞬态分析

E. Jones, Zheyu Zhang, Fred Wang
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引用次数: 17

摘要

宽带隙器件的高开关速度要求新的分析方法来解释导通和关断瞬态的电压波形。虽然米勒效应仍然是一个主要特征,但传统的米勒平台方程不能准确地模拟快速开关器件(如氮化镓场效应管)的dvd /dt。本文在考虑米勒效应和结电容电荷通过饱和通道位移的基础上,导出了基于静态数据参数的瞬时dvd /dt方程。这些方程将通过在一系列操作条件下的增强型GaN场效应管的实验结果进行验证。此外,利用推导的方程预测了峰值dvd /dt,并与GaN实验结果进行了比较,结果表明该模型比其他模型更准确。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of the dv/dt transient of enhancement-mode GaN FETs
The higher switching speed of wide bandgap devices requires new analysis to interpret voltage waveforms during turn-on and turn-off transients. Although the Miller effect remains a dominant feature, the conventional Miller plateau equations do not accurately model the dvds/dt for fast-switching devices such as GaN FETs. This paper derives equations for instantaneous dvds/dt based on static datasheet parameters, considering the Miller effect and the displacement of junction capacitance charges through the saturated channel. These equations will be verified with experimental results for an enhancement-mode GaN FET across a range of operating conditions. Furthermore, the peak dvds/dt is predicted using the derived equations, and shown to be more accurate than other models when compared to GaN experimental results.
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