电子工业在焊接阶段关于金属间化合物形成的制造问题

H. D. Blair, T. Pan, J. Nicholson, R. Cooper, Sung-Won Oh, A. Farah
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引用次数: 19

摘要

金属间化合物(IMC)是焊接过程中不可避免的产物。这是良好的冶金结合的标志。但是,如果它在焊接或随后的固相时效过程中变得太厚,则会对接头的强度或组件的后续可焊性产生有害影响。文献研究大多集中在固相时效过程中IMC的生长。少数论文讨论了熔融阶段IMC的形成,但这些研究大多是在温度和时间范围内进行的,不适用于制造焊接过程。本文研究了100Sn、96.5Sn-3.5Ag和63Sn-37Pb焊料在模拟印刷配线板的电镀铜和模拟元件引线和电连接器的轧制OFHC铜片上的熔融阶段Cu/sub 6/Sn/sub 5/ IMC的生长机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Manufacturing concerns of the electronic industry regarding intermetallic compound formation during the soldering stage
The intermetallic compound (IMC) formed at the interface between the solder and substrate is an inevitable result of the soldering process. It is an indication of good metallurgical bonding. But if it grows too thick, either during soldering or subsequent solid stage aging, it can have a deleterious effect on the strength of a joint or on the subsequent solderability of a component. Most of the literature studies have concentrated on the IMC growth during the solid stage aging. A few papers addressed the IMC formation during the molten stage, but most of these studies were in a temperature and time domain not applicable to the manufacturing soldering process. In this study, we examined the growth mechanism of the Cu/sub 6/Sn/sub 5/ IMC in the molten stage between 100Sn, 96.5Sn-3.5Ag, and 63Sn-37Pb solders on electroplated copper, which mimics the printed-wiring boards, and on rolled OFHC copper sheet, which simulates the component leads and electrical connectors.
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